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Pore distribution in pure quartz shear bands of the Naxos granite (Greece). (A) Location of the sampling area at the rim of the Naxos western granite nearby the central Cycladic detachment (red line). (B) Backscattered Electron (BSE) images and their companion <t>EBSD</t> maps (acquired at a step size of 0.25 μm; see the Method section) of a pure quartz shear band decorated by <t>micropores.</t> <t>SEM</t> images are located in supplementary Fig. 1. While white circles indicate the intersection points between grain boundaries and substructures, the red circles/ellipses highlight the sections of decorated grain boundaries that do not intersect with any substructure, as revealed by Kernel Average Misorientations (KAM). The parameters used to produce KAM maps are described in SI. Grain (black) and subgrain (red) boundaries respectively indicate point-to-point misorientations higher than 6° and between 2° and 6°. Inner boundaries are also revealed by KAM “lines” where subgrain boundaries are not present, i.e. where point-to-point misorientations remain lower than 2°. Close-up BSE and KAM images highlight pores along grain (B 1 ) , inner (B 2 ) and subgrain (B 3 ) boundaries. (C) Transects of misorientation angle across the decorated (intra)grain boundaries shown in B . Misorientation angles are calculated for each EBSD point/pixel of the transect with respect to the first point (white dot on SEM images in B ).
Oxford Instruments Ebsd System, supplied by Oxford Instruments, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Pore distribution in pure quartz shear bands of the Naxos granite (Greece). (A) Location of the sampling area at the rim of the Naxos western granite nearby the central Cycladic detachment (red line). (B) Backscattered Electron (BSE) images and their companion <t>EBSD</t> maps (acquired at a step size of 0.25 μm; see the Method section) of a pure quartz shear band decorated by <t>micropores.</t> <t>SEM</t> images are located in supplementary Fig. 1. While white circles indicate the intersection points between grain boundaries and substructures, the red circles/ellipses highlight the sections of decorated grain boundaries that do not intersect with any substructure, as revealed by Kernel Average Misorientations (KAM). The parameters used to produce KAM maps are described in SI. Grain (black) and subgrain (red) boundaries respectively indicate point-to-point misorientations higher than 6° and between 2° and 6°. Inner boundaries are also revealed by KAM “lines” where subgrain boundaries are not present, i.e. where point-to-point misorientations remain lower than 2°. Close-up BSE and KAM images highlight pores along grain (B 1 ) , inner (B 2 ) and subgrain (B 3 ) boundaries. (C) Transects of misorientation angle across the decorated (intra)grain boundaries shown in B . Misorientation angles are calculated for each EBSD point/pixel of the transect with respect to the first point (white dot on SEM images in B ).
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Pore distribution in pure quartz shear bands of the Naxos granite (Greece). (A) Location of the sampling area at the rim of the Naxos western granite nearby the central Cycladic detachment (red line). (B) Backscattered Electron (BSE) images and their companion <t>EBSD</t> maps (acquired at a step size of 0.25 μm; see the Method section) of a pure quartz shear band decorated by <t>micropores.</t> <t>SEM</t> images are located in supplementary Fig. 1. While white circles indicate the intersection points between grain boundaries and substructures, the red circles/ellipses highlight the sections of decorated grain boundaries that do not intersect with any substructure, as revealed by Kernel Average Misorientations (KAM). The parameters used to produce KAM maps are described in SI. Grain (black) and subgrain (red) boundaries respectively indicate point-to-point misorientations higher than 6° and between 2° and 6°. Inner boundaries are also revealed by KAM “lines” where subgrain boundaries are not present, i.e. where point-to-point misorientations remain lower than 2°. Close-up BSE and KAM images highlight pores along grain (B 1 ) , inner (B 2 ) and subgrain (B 3 ) boundaries. (C) Transects of misorientation angle across the decorated (intra)grain boundaries shown in B . Misorientation angles are calculated for each EBSD point/pixel of the transect with respect to the first point (white dot on SEM images in B ).
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Pore distribution in pure quartz shear bands of the Naxos granite (Greece). (A) Location of the sampling area at the rim of the Naxos western granite nearby the central Cycladic detachment (red line). (B) Backscattered Electron (BSE) images and their companion <t>EBSD</t> maps (acquired at a step size of 0.25 μm; see the Method section) of a pure quartz shear band decorated by <t>micropores.</t> <t>SEM</t> images are located in supplementary Fig. 1. While white circles indicate the intersection points between grain boundaries and substructures, the red circles/ellipses highlight the sections of decorated grain boundaries that do not intersect with any substructure, as revealed by Kernel Average Misorientations (KAM). The parameters used to produce KAM maps are described in SI. Grain (black) and subgrain (red) boundaries respectively indicate point-to-point misorientations higher than 6° and between 2° and 6°. Inner boundaries are also revealed by KAM “lines” where subgrain boundaries are not present, i.e. where point-to-point misorientations remain lower than 2°. Close-up BSE and KAM images highlight pores along grain (B 1 ) , inner (B 2 ) and subgrain (B 3 ) boundaries. (C) Transects of misorientation angle across the decorated (intra)grain boundaries shown in B . Misorientation angles are calculated for each EBSD point/pixel of the transect with respect to the first point (white dot on SEM images in B ).
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Pore distribution in pure quartz shear bands of the Naxos granite (Greece). (A) Location of the sampling area at the rim of the Naxos western granite nearby the central Cycladic detachment (red line). (B) Backscattered Electron (BSE) images and their companion <t>EBSD</t> maps (acquired at a step size of 0.25 μm; see the Method section) of a pure quartz shear band decorated by <t>micropores.</t> <t>SEM</t> images are located in supplementary Fig. 1. While white circles indicate the intersection points between grain boundaries and substructures, the red circles/ellipses highlight the sections of decorated grain boundaries that do not intersect with any substructure, as revealed by Kernel Average Misorientations (KAM). The parameters used to produce KAM maps are described in SI. Grain (black) and subgrain (red) boundaries respectively indicate point-to-point misorientations higher than 6° and between 2° and 6°. Inner boundaries are also revealed by KAM “lines” where subgrain boundaries are not present, i.e. where point-to-point misorientations remain lower than 2°. Close-up BSE and KAM images highlight pores along grain (B 1 ) , inner (B 2 ) and subgrain (B 3 ) boundaries. (C) Transects of misorientation angle across the decorated (intra)grain boundaries shown in B . Misorientation angles are calculated for each EBSD point/pixel of the transect with respect to the first point (white dot on SEM images in B ).
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Pore distribution in pure quartz shear bands of the Naxos granite (Greece). (A) Location of the sampling area at the rim of the Naxos western granite nearby the central Cycladic detachment (red line). (B) Backscattered Electron (BSE) images and their companion <t>EBSD</t> maps (acquired at a step size of 0.25 μm; see the Method section) of a pure quartz shear band decorated by <t>micropores.</t> <t>SEM</t> images are located in supplementary Fig. 1. While white circles indicate the intersection points between grain boundaries and substructures, the red circles/ellipses highlight the sections of decorated grain boundaries that do not intersect with any substructure, as revealed by Kernel Average Misorientations (KAM). The parameters used to produce KAM maps are described in SI. Grain (black) and subgrain (red) boundaries respectively indicate point-to-point misorientations higher than 6° and between 2° and 6°. Inner boundaries are also revealed by KAM “lines” where subgrain boundaries are not present, i.e. where point-to-point misorientations remain lower than 2°. Close-up BSE and KAM images highlight pores along grain (B 1 ) , inner (B 2 ) and subgrain (B 3 ) boundaries. (C) Transects of misorientation angle across the decorated (intra)grain boundaries shown in B . Misorientation angles are calculated for each EBSD point/pixel of the transect with respect to the first point (white dot on SEM images in B ).
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Oxford Instruments symmetry s3 ebsd detector
Pore distribution in pure quartz shear bands of the Naxos granite (Greece). (A) Location of the sampling area at the rim of the Naxos western granite nearby the central Cycladic detachment (red line). (B) Backscattered Electron (BSE) images and their companion <t>EBSD</t> maps (acquired at a step size of 0.25 μm; see the Method section) of a pure quartz shear band decorated by <t>micropores.</t> <t>SEM</t> images are located in supplementary Fig. 1. While white circles indicate the intersection points between grain boundaries and substructures, the red circles/ellipses highlight the sections of decorated grain boundaries that do not intersect with any substructure, as revealed by Kernel Average Misorientations (KAM). The parameters used to produce KAM maps are described in SI. Grain (black) and subgrain (red) boundaries respectively indicate point-to-point misorientations higher than 6° and between 2° and 6°. Inner boundaries are also revealed by KAM “lines” where subgrain boundaries are not present, i.e. where point-to-point misorientations remain lower than 2°. Close-up BSE and KAM images highlight pores along grain (B 1 ) , inner (B 2 ) and subgrain (B 3 ) boundaries. (C) Transects of misorientation angle across the decorated (intra)grain boundaries shown in B . Misorientation angles are calculated for each EBSD point/pixel of the transect with respect to the first point (white dot on SEM images in B ).
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Image Search Results


Pore distribution in pure quartz shear bands of the Naxos granite (Greece). (A) Location of the sampling area at the rim of the Naxos western granite nearby the central Cycladic detachment (red line). (B) Backscattered Electron (BSE) images and their companion EBSD maps (acquired at a step size of 0.25 μm; see the Method section) of a pure quartz shear band decorated by micropores. SEM images are located in supplementary Fig. 1. While white circles indicate the intersection points between grain boundaries and substructures, the red circles/ellipses highlight the sections of decorated grain boundaries that do not intersect with any substructure, as revealed by Kernel Average Misorientations (KAM). The parameters used to produce KAM maps are described in SI. Grain (black) and subgrain (red) boundaries respectively indicate point-to-point misorientations higher than 6° and between 2° and 6°. Inner boundaries are also revealed by KAM “lines” where subgrain boundaries are not present, i.e. where point-to-point misorientations remain lower than 2°. Close-up BSE and KAM images highlight pores along grain (B 1 ) , inner (B 2 ) and subgrain (B 3 ) boundaries. (C) Transects of misorientation angle across the decorated (intra)grain boundaries shown in B . Misorientation angles are calculated for each EBSD point/pixel of the transect with respect to the first point (white dot on SEM images in B ).

Journal: Scientific Reports

Article Title: Quartz porosity in amorphous SiO 2 of granitic shear bands

doi: 10.1038/s41598-026-37576-x

Figure Lengend Snippet: Pore distribution in pure quartz shear bands of the Naxos granite (Greece). (A) Location of the sampling area at the rim of the Naxos western granite nearby the central Cycladic detachment (red line). (B) Backscattered Electron (BSE) images and their companion EBSD maps (acquired at a step size of 0.25 μm; see the Method section) of a pure quartz shear band decorated by micropores. SEM images are located in supplementary Fig. 1. While white circles indicate the intersection points between grain boundaries and substructures, the red circles/ellipses highlight the sections of decorated grain boundaries that do not intersect with any substructure, as revealed by Kernel Average Misorientations (KAM). The parameters used to produce KAM maps are described in SI. Grain (black) and subgrain (red) boundaries respectively indicate point-to-point misorientations higher than 6° and between 2° and 6°. Inner boundaries are also revealed by KAM “lines” where subgrain boundaries are not present, i.e. where point-to-point misorientations remain lower than 2°. Close-up BSE and KAM images highlight pores along grain (B 1 ) , inner (B 2 ) and subgrain (B 3 ) boundaries. (C) Transects of misorientation angle across the decorated (intra)grain boundaries shown in B . Misorientation angles are calculated for each EBSD point/pixel of the transect with respect to the first point (white dot on SEM images in B ).

Article Snippet: Scanning electron microscope (SEM) images and electron backscatter diffraction (EBSD) data have been acquired on a polished thin section using a FEG (field-emission-gun) SEM from JEOL (IT800SHL) coupled to an Oxford Instruments EBSD system with advanced Symmetry detector.

Techniques: Shear, Sampling, Western Blot