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rigaku smart lab diffractometer  (Rigaku Corporation)


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  • 99

    Structured Review

    Rigaku Corporation rigaku smart lab diffractometer
    Rigaku Smart Lab Diffractometer, supplied by Rigaku Corporation, used in various techniques. Bioz Stars score: 99/100, based on 44197 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/smart+diffractometer/SmartLab/pmc13629382-108-10-10
    Average 99 stars, based on 44197 article reviews
    rigaku smart lab diffractometer - by Bioz Stars, 2026-10
    99/100 stars

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    Related Articles

    Thin Films:

    Article Title: A Scalable Spin‐Coating Strategy for Mesoporous Gold Thin Films toward miRNA Detection
    Article Snippet: Detailed cross‐sectional S/TEM images were obtained using a Hitachi HF5000 operated in TEM and STEM configuration on a lamella sample mounted on a Si grid. .. Crystallographic information for the spin‐coated thin films was recorded using a Rigaku SmartLab XRD instrument with Cu Kα radiation. .. All electrochemical characterizations were performed using CH Instruments in a 3‐electrode configuration with Ag/AgCl (in 3 M saturated KCl solution) reference and Pt wire as the counter electrode.

    X-ray Diffraction:

    Article Title: A Scalable Spin‐Coating Strategy for Mesoporous Gold Thin Films toward miRNA Detection
    Article Snippet: Detailed cross‐sectional S/TEM images were obtained using a Hitachi HF5000 operated in TEM and STEM configuration on a lamella sample mounted on a Si grid. .. Crystallographic information for the spin‐coated thin films was recorded using a Rigaku SmartLab XRD instrument with Cu Kα radiation. .. All electrochemical characterizations were performed using CH Instruments in a 3‐electrode configuration with Ag/AgCl (in 3 M saturated KCl solution) reference and Pt wire as the counter electrode.

    Article Title: Ultrasound assisted in-situ dual-laser beam fabrication of high-performance Ni60A coating
    Article Snippet: During the preparation of high-hardness alloys such as Ni60A by laser cladding (LC), the thermal stress induced by high temperature gradients easily leads to severe crack defects.. This study proposes an ultrasound-assisted insitu double laser beam synchronous deposition process.. The synergy of thermal and acoustic fields enables in-situ stress relaxation and compensatory microstructural refinement, allowing for the one-step preparation of crackfree, high-performance coatings.

    Article Title: Van der Waals Gap‐Confined Molecular Engineering of MoS 2 for Selectivity‐Enhanced and Humidity‐Tolerant Gas Sensing
    Article Snippet: .. To examine changes in the interlayer spacing and crystallographic structure, x‐ray diffraction (XRD) analysis was conducted using a SmartLab diffractometer (Rigaku) with Cu Kα radiation (λ = 0.15412 nm). .. The interlayer spacing was calculated using Bragg's law ( n λ = 2d sin(θ) ), where d is the spacing between adjacent layers, λ is the x‐ray wavelength, and θ is the diffraction angle.

    Article Title: Homogeneous N-polar AlScN sputtered films using a single AlSc alloy target and in-situ AlSc template
    Article Snippet: This study investigates the influence of in-situ AlSc template thickness, on Si substrate, using a AlSc alloy target to achieve a high-quality homogeneous N-polar AlScN sputter film without AOG (abnormally oriented grains) formation.. The influence of template thickness and DC sputtering power on the structural, topographical, and ferroelectric properties of the N-polar AlScN thin films was studied.. High-resolution X-ray diffraction (XRD) reveals that a minimum 10 nm of in-situ AlSc seed layer is essential for initiating c-axis oriented growth, e.g., with optimal crystalline alignment (FWHM = 2.6) achieved using 75 nm AlSc thickness for 400 nm of AlScN films.

    Article Title: Skyrmion-like spin texture and their magnetic entropy signatures in Dy6MnBi2
    Article Snippet: .. Powder X-ray Diffraction (XRD): XRD patterns of the powder samples were collected using an X-ray diffractometer (Rigaku SmartLab with Cu Kα radiation) in step-scan mode, with a step size of 0.02◦, a dwell time of 2.0 s per step, and a diffraction angle range of 10–110◦. ..

    Article Title: Investigation of the photocatalytic capabilities of green-synthesized CeO2–ZnO nanocomposites for degrading acid orange 7 dye under sunlight
    Article Snippet: .. The phase composition, crystalline structure, and dimensions of the CeO2–ZnO nanocomposite were thoroughly examined using the Rigaku Smart Lab X-ray Diffraction (XRD) system in Baghdad, Iraq. ..

    Article Title: Electrochemical Investigation of Compatibility Between Chloride‐ and Sulfide‐Based Solid Electrolytes Using Four‐Electrode Cells
    Article Snippet: .. XRD measurements were performed using an X‐ray diffractometer (SmartLab, Rigaku) with Cu Kα1 radiation. ..

    Article Title: Starch-based thermoreversible Diels-Alder networks: Thermally processable thermoplastic starch with retarded retrogradation
    Article Snippet: Thermoplastic starch (TPS) offers a sustainable alternative to conventional plastics because of its biodegradability, abundance, and low cost, but its susceptibility to plasticizer migration and retrogradation limits longterm stability and can cause surface stickiness.. Although covalent crosslinking can suppress retrogradation, permanent networks compromise thermal processability and the ability to compound TPS with other polymers.. Herein, thermoreversible Diels-Alder (DA) crosslinks are introduced between starch (St) and glycerol (Gly) to address this trade-off.

    Analysis:

    Article Title: Van der Waals Gap‐Confined Molecular Engineering of MoS 2 for Selectivity‐Enhanced and Humidity‐Tolerant Gas Sensing
    Article Snippet: .. To examine changes in the interlayer spacing and crystallographic structure, x‐ray diffraction (XRD) analysis was conducted using a SmartLab diffractometer (Rigaku) with Cu Kα radiation (λ = 0.15412 nm). .. The interlayer spacing was calculated using Bragg's law ( n λ = 2d sin(θ) ), where d is the spacing between adjacent layers, λ is the x‐ray wavelength, and θ is the diffraction angle.



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