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ANSYS inc fea algorithm
<t>Substep</t> optimization of <t>FEA</t> under compressive loading. Mean and standard deviation of relative modulus values are shown as a function of substep number. At substep number of 50 and higher, 100% relative modulus was achieved for all specimens. For both x‐ and y‐shear loading, 100% relative modulus was observed for all specimens at the smallest substep number of 5 (data not shown).
Fea Algorithm, supplied by ANSYS inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/fea+algorithm/fea+algorithms/pmc09189917-105-12-19
Average 90 stars, based on 1 article reviews
fea algorithm - by Bioz Stars, 2026-09
90/100 stars

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1) Product Images from "Computed Tomography– Based Stiffness Measures of Trabecular Bone Microstructure: Cadaveric Validation and In Vivo Application"

Article Title: Computed Tomography– Based Stiffness Measures of Trabecular Bone Microstructure: Cadaveric Validation and In Vivo Application

Journal: JBMR Plus

doi: 10.1002/jbm4.10627

Substep optimization of FEA under compressive loading. Mean and standard deviation of relative modulus values are shown as a function of substep number. At substep number of 50 and higher, 100% relative modulus was achieved for all specimens. For both x‐ and y‐shear loading, 100% relative modulus was observed for all specimens at the smallest substep number of 5 (data not shown).
Figure Legend Snippet: Substep optimization of FEA under compressive loading. Mean and standard deviation of relative modulus values are shown as a function of substep number. At substep number of 50 and higher, 100% relative modulus was achieved for all specimens. For both x‐ and y‐shear loading, 100% relative modulus was observed for all specimens at the smallest substep number of 5 (data not shown).

Techniques Used: Standard Deviation, Shear

Related Articles

other:

Article Title: Computed Tomography– Based Stiffness Measures of Trabecular Bone Microstructure: Cadaveric Validation and In Vivo Application
Article Snippet: The substep number and the force and displacement convergence parameters of the FEA algorithm were experimentally optimized within the ANSYS setup.

Concentration Assay:

Article Title: Prediction of Electromigration Induced Voids and Time to Failure for Solder Joint of a Wafer Level Chip Scale Package
Article Snippet: This paper proposes a new prediction method for electromigration (EM) induced void generation of solder bumps in a wafer level chip scale package.. The methodology is developed based on discretized weighted residual method in a user-defined finite element analysis framework to solve the local ME governing equation with the variable of atomic concentration.. The local solution of atomic concentration is incorporated in the multiphysics environment for electrical, thermal and stress in both submodel and global model.



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Substep optimization of FEA under compressive loading. Mean and standard deviation of relative modulus values are shown as a function of substep number. At substep number of 50 and higher, 100% relative modulus was achieved for all specimens. For both x‐ and y‐shear loading, 100% relative modulus was observed for all specimens at the smallest substep number of 5 (data not shown).

Journal: JBMR Plus

Article Title: Computed Tomography– Based Stiffness Measures of Trabecular Bone Microstructure: Cadaveric Validation and In Vivo Application

doi: 10.1002/jbm4.10627

Figure Lengend Snippet: Substep optimization of FEA under compressive loading. Mean and standard deviation of relative modulus values are shown as a function of substep number. At substep number of 50 and higher, 100% relative modulus was achieved for all specimens. For both x‐ and y‐shear loading, 100% relative modulus was observed for all specimens at the smallest substep number of 5 (data not shown).

Article Snippet: The substep number and the force and displacement convergence parameters of the FEA algorithm were experimentally optimized within the ANSYS setup.

Techniques: Standard Deviation, Shear