Journal: Nanomaterials

Article Title: In Situ TEM Observation of Electric Field-Directed Self-Assembly of PbS and PbSe Nanoparticles

doi: 10.3390/nano15161275

Figure Lengend Snippet: Pristine PbSe single crystal. ( a , b ) Light microscopy image. ( c , d ) TEM overview shows high density of dislocations and defects. ( e , f ) High-resolution and processed FFT in the [001] orientation. Occurrence of nanodomains in the range of 2–5 nm in diameter with additional reflections. ( g , h ) High-resolution image and derived FFT of PbSe with regular lattice.

Article Snippet: The point resolution of the TEM was 2.0 Å, and the information limit was around 1.2 Å. High-resolution TEM (HR-TEM) of the PbSe single crystal was carried out using the double-corrected JEM-ARM300F electron microscope operating at 300 kV (Dresden Grand ARM, JEOL Company, Akishima, Japan).

Techniques: Light Microscopy, Derivative Assay

Journal: Nanomaterials

Article Title: In Situ TEM Observation of Electric Field-Directed Self-Assembly of PbS and PbSe Nanoparticles

doi: 10.3390/nano15161275

Figure Lengend Snippet: High-resolution TEM of the pristine PbSe single crystal. ( a ) Magnified area of e, bottom right. The nanodomain consists of 8 units with a cell, which shows doubling of the regular unit cell along the a and b axes. ( b ) Processed FFT with additional reflections (red circles) indicating approximate doubling of the cell parameters. ( c , d ) High-resolution image and its derived FFT of pristine PbSe with apparent regular lattice. However, reflections at about 5.12 Å and 5.31 Å are also detected (red circles). ( e ) Possible model of chessboard structure imaged in ( a ); however, with 3-fold “superstructure” instead of doubling. Pb interstitials and gap formation due to lone pairs of Pb are indicated. Lead is indicated by grey; Se is indicated by yellow.

Article Snippet: The point resolution of the TEM was 2.0 Å, and the information limit was around 1.2 Å. High-resolution TEM (HR-TEM) of the PbSe single crystal was carried out using the double-corrected JEM-ARM300F electron microscope operating at 300 kV (Dresden Grand ARM, JEOL Company, Akishima, Japan).

Techniques: Derivative Assay

Journal: Nanomaterials

Article Title: In Situ TEM Observation of Electric Field-Directed Self-Assembly of PbS and PbSe Nanoparticles

doi: 10.3390/nano15161275

Figure Lengend Snippet: Convergent electron beam treatment of PbSe and PbS single crystals: ( a ) Original single-crystalline PbSe particle before heavy electron beam irradiation. ( b ) The same single-crystalline PbSe particle after irradiation is surrounded by fragmentation products. ( c ) Original single-crystalline PbS particle before electron beam irradiation. ( d ) The same PbS single-crystalline particle after irradiation, surrounded by fragmentation products.

Article Snippet: The point resolution of the TEM was 2.0 Å, and the information limit was around 1.2 Å. High-resolution TEM (HR-TEM) of the PbSe single crystal was carried out using the double-corrected JEM-ARM300F electron microscope operating at 300 kV (Dresden Grand ARM, JEOL Company, Akishima, Japan).

Techniques: Irradiation

Journal: Nanomaterials

Article Title: In Situ TEM Observation of Electric Field-Directed Self-Assembly of PbS and PbSe Nanoparticles

doi: 10.3390/nano15161275

Figure Lengend Snippet: Dynamics (time-dependent series) of PbSe grain transformation during electron beam irradiation in the nanofilm. Some grains grew steadily (see red circle), whereas others continuously decreased in size and were resorbed (yellow arrow). ( a ) The initially formed PbSe nanofilm was composed of grains of different sizes and shapes. ( b , c ) Some of the smaller grains were gradually absorbed by larger grains. ( d ) Stabilized PbSe nanofilm with stable grain borders.

Article Snippet: The point resolution of the TEM was 2.0 Å, and the information limit was around 1.2 Å. High-resolution TEM (HR-TEM) of the PbSe single crystal was carried out using the double-corrected JEM-ARM300F electron microscope operating at 300 kV (Dresden Grand ARM, JEOL Company, Akishima, Japan).

Techniques: Transformation Assay, Irradiation

Journal: Nanomaterials

Article Title: In Situ TEM Observation of Electric Field-Directed Self-Assembly of PbS and PbSe Nanoparticles

doi: 10.3390/nano15161275

Figure Lengend Snippet: ( a – d ) Condensate products of single-crystal PbSe fragmentation after electron beam irradiation: ( a ) PbSe nanoparticles of different shapes (often truncated bars). ( b ) Perfect rectangle PbSe nanoparticle without truncated vertices. ( c ) Fused truncated squares with screw dislocation at their boundary (red arrow). ( d ) Merged nanoparticles with edge dislocation at their boundary (red arrow). ( e – h ) Formation and growth of PbS nanoparticles under electron beam irradiation, time series: ( e , f ) Stochastic nucleation of PbS seeds with further gradual growth on the carbon film while the initial micro-sized particle gradually evaporates. ( g , h ) Bars that come into contact merge, resulting in particles with shapes that significantly deviate from rectangular (red circles).

Article Snippet: The point resolution of the TEM was 2.0 Å, and the information limit was around 1.2 Å. High-resolution TEM (HR-TEM) of the PbSe single crystal was carried out using the double-corrected JEM-ARM300F electron microscope operating at 300 kV (Dresden Grand ARM, JEOL Company, Akishima, Japan).

Techniques: Irradiation