Journal: medRxiv

Article Title: Spectral Analysis Comparison of Pushbroom and Snapshot Hyperspectral Cameras for In-Vivo Brain Tissues and Chromophores Identification

doi: 10.1101/2024.06.06.24308500

Figure Lengend Snippet: Mean reflectance spectral signatures with standard deviation of all pixels included inside the 5×5 ROIs from both HS cameras. The shorter spectral signatures from 661.61 to 951.42 nm nm with continuous lines correspond to the snapshot camera, while the longer spectral signature with dashed lines correspond to the linescan camera. The dashed rectangles indicate the spectral bands of the HS snapshot camera influenced by the infrared of the depth camera.

Article Snippet: The first step is to obtain the reflectance information of the material interrogated by calibrating the raw information obtained with the sensor. eliminates the effect of the HS sensor and the lighting conditions captured with the raw images to obtain the reflectance information R from the sample, where I raw is the captured raw data of the sample, I dark is the raw dark reference captured with the lens cap in front of the camera lens, and I white is the raw white reference intensity reflected over a Lambertian diffuse target with 95% of reflectance values (SG 3151-U, SphereOptics GmbH, Germany).

Techniques: Standard Deviation

Journal: Materials

Article Title: High-Pressure Synthesis of Cubic ZnO and Its Solid Solutions with MgO Doped with Li, Na, and K

doi: 10.3390/ma16155341

Figure Lengend Snippet: Normalized Tauc plots of rs-ZnO ( a ), MZ20 ( b ) and MZ30 ( c ). Red curves correspond to indirect transitions (the plot constructed using n = 2 in Equation (4)), green curves correspond to direct transitions (the plot constructed using n = ½ in Equation (4)). Hollow black circles and black lines denote linearized segments of the graphs. Insets show original reflectance spectra. Insets show original reflectance spectra (blue curves).

Article Snippet: Diffuse reflectance (DR) spectra were recorded using a Lambda 950 spectrophotometer (Perkin Elmer, Waltham, MA, USA).

Techniques: Construct