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open-ended rectangular microchannel uncoated #1.5 μm-slide vi 0.4  (ibidi GmbH)

 
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    Structured Review

    ibidi GmbH open-ended rectangular microchannel uncoated #1.5 μm-slide vi 0.4
    Open Ended Rectangular Microchannel Uncoated #1.5 μm Slide Vi 0.4, supplied by ibidi GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/rectangular+microchannel/open+ended+rectangular+microchannel+uncoated++1+5+%CE%BCm+slide+vi+0+4/pm36412554-133-3-10
    Average 90 stars, based on 1 article reviews
    open-ended rectangular microchannel uncoated #1.5 μm-slide vi 0.4 - by Bioz Stars, 2026-09
    90/100 stars

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    other:

    Article Title: Single-particle electrophoresis for studying the adsorption of cationic polymers onto anionic particles.
    Article Snippet: The commercial open-ended rectangular microchannel (uncoated #1.5 μ-Slide VI 0.4, ibidi GmbH, Martinsried, Germany) has a width, length, and height of 3.8 mm, 17 mm, and 400 μm, respectively.



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    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
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    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
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    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, <t>microchannel</t> plate.
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    Image Search Results


    a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, microchannel plate.

    Journal: Nature Materials

    Article Title: Probing lithium mobility at a solid electrolyte surface

    doi: 10.1038/s41563-023-01535-y

    Figure Lengend Snippet: a , Basic crystal structure of LLTO, consisting of alternating Li-rich and -poor layers and Ti and O octahedra. b , Calculated partial density of states (DOS) for LLTO and indicated transitions for the XUV-SHG probe. c , Overview of the experimental setup used for measurement of XUV-SHG data in reflection geometry. The inset shows the layered sample structure with repeating layers of LLTO and LCO. d , Schematic representation of an LCO–LLTO stack forming a prototypical battery, with the XUV-SHG process indicated on the top surface; note that LLTO is polycrystalline in the film measured despite the schematic representation. XFEL, X-ray free-electron laser. MCP, microchannel plate.

    Article Snippet: The beam was dispersed using a diffraction grating with 1,200 grooves mm –1 before collection on a microchannel plate detector (Rectangular, Hamamatsu Photonics) coated with CsI.

    Techniques: Battery