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OVITO GmbH dislocation extraction algorithm dxa
Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the <t>dislocation</t> network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the <t>DXA</t> analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.
Dislocation Extraction Algorithm Dxa, supplied by OVITO GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/dislocation+extraction+algorithm+dxa/dislocation+extraction+algorithm++dxa+/pmc12079803-359-8-18
Average 90 stars, based on 1 article reviews
dislocation extraction algorithm dxa - by Bioz Stars, 2026-09
90/100 stars

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1) Product Images from "Novel Method for Realistically Simulating the Deposition of Thin Films from the Gas Phase and its Application to Study the Growth of Thin Gold Film on Crystalline Silicon"

Article Title: Novel Method for Realistically Simulating the Deposition of Thin Films from the Gas Phase and its Application to Study the Growth of Thin Gold Film on Crystalline Silicon

Journal: Journal of Chemical Theory and Computation

doi: 10.1021/acs.jctc.5c00319

Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the dislocation network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the DXA analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.
Figure Legend Snippet: Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the dislocation network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the DXA analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.

Techniques Used:

Related Articles

Extraction:

Article Title: Novel Method for Realistically Simulating the Deposition of Thin Films from the Gas Phase and its Application to Study the Growth of Thin Gold Film on Crystalline Silicon.
Article Snippet: .. We also used other analysis methods, including the dislocation extraction algorithm (DXA) proposed by Stukowski,75,76 implemented in OVITO,77 a program that we used for performing structural analyses (PTM, IDS and DXA) and for preparing visualizations. ..

Article Title: Plasticity tuning of thermal conductivity between nanoparticles
Article Snippet: We study the effects of uniaxial pressure on the thermal conductivity between two nanoparticles using atomistic simulation.. While the system is compressed, we analyze the evolution of contact area, the relative density, and the dislocation density.. Lattice thermal conductivity is calculated by non-equilibrium molecular dynamics simulations at several stages of the compression.

Article Title:
Article Snippet: .. Dislocations are identified using the dislocation extraction algorithm in OVITO.12,15 Initial Vacancies created above transformed half. ..

Article Title: Novel Method for Realistically Simulating the Deposition of Thin Films from the Gas Phase and its Application to Study the Growth of Thin Gold Film on Crystalline Silicon
Article Snippet: .. We also used other analysis methods, including the dislocation extraction algorithm (DXA) proposed by Stukowski, , implemented in OVITO, a program that we used for performing structural analyses (PTM, IDS and DXA) and for preparing visualizations. ..

Article Title: Porosity dependence of mechanical properties of titanium nanofoams.
Article Snippet: Context This study employs molecular dynamics (MD) simulations to investigate the mechanical properties and deformation mechanisms of titanium (Ti) nanofoam under uniaxial tensile loading.. The effects of porosity (ranging from 20 to 50%), strain rate (from 5 × 108 to 5 × 109 s−1), and temperature (from 300 to 900 K) on the tensile response are systematically examined.. The results reveal that increasing porosity significantly reduces the ultimate tensile strength (UTS) and elastic modulus, while intensifying localized shear strain and stress concentration.

Article Title: Neural network potential for dislocation plasticity in ceramics
Article Snippet: .. AllMD simulationswere performed using the large-scale atomic/molecular massively parallel simulator (LAMMPS) code93.We analyzed andvisualized atomic configurations of dislocation with the identify diamond structure (IDS)94 and dislocation extraction algorithm (DXA)95 tools of the OVITO program96. ..

Article Title: Maintaining Grain Boundary Segregation-Induced Strengthening Effect in Extremely Fine Nanograined Metals
Article Snippet: .. Information on dislocation line length was extracted from the MD trajectories using the dislocation extraction algorithm (DXA) in OVITO software. ..

other:

Article Title: Influence of grain boundary segregation on the deformation behavior of nanocrystalline Ni50Co50 solid solution alloys investigated by molecular dynamics simulations
Article Snippet: For dislocation identification, the dislocation extraction algorithm (DXA) within OVITO was utilized [39].

Transformation Assay:

Article Title:
Article Snippet: .. Dislocations are identified using the dislocation extraction algorithm in OVITO.12,15 Initial Vacancies created above transformed half. ..



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Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the <t>dislocation</t> network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the <t>DXA</t> analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.
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Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the <t>dislocation</t> network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the <t>DXA</t> analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.
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Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the <t>dislocation</t> network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the <t>DXA</t> analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.
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Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the <t>dislocation</t> network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the <t>DXA</t> analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.
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Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the <t>dislocation</t> network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the <t>DXA</t> analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.
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Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the <t>dislocation</t> network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the <t>DXA</t> analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.
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Image Search Results


Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the dislocation network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the DXA analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.

Journal: Journal of Chemical Theory and Computation

Article Title: Novel Method for Realistically Simulating the Deposition of Thin Films from the Gas Phase and its Application to Study the Growth of Thin Gold Film on Crystalline Silicon

doi: 10.1021/acs.jctc.5c00319

Figure Lengend Snippet: Dislocations and stacking faults. Panel (a) shows the fly view of the system, presenting a line-based representation of the dislocation network combined with a sphere-based representation of stacking faults (Au atoms with hcp local structure are shown). The table in panel (b) summarizes the results of the DXA analysis and explains the color coding used in panel (a). The number of identified dislocation segments and their total length are given for each dislocation type.

Article Snippet: We also used other analysis methods, including the dislocation extraction algorithm (DXA) proposed by Stukowski, , implemented in OVITO, a program that we used for performing structural analyses (PTM, IDS and DXA) and for preparing visualizations.

Techniques: