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uv visible diffuse reflectance spectroscopy drs data  (JASCO Inc)


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    JASCO Inc uv visible diffuse reflectance spectroscopy drs data
    a Scanning electron microscopy (SEM) image of synthesized BSTON(TN0.2) solid-solution particles. b X-ray diffraction (XRD) pattern for the same sample. c Enlarged view of (110) diffraction peak region. The blue and green bars indicate the (110) peak positions for BaTaO 2 N (JCPDS card No. 40-0566) and SrTaO 2 N (JCPDS card No. 40-0662), respectively. d Ultraviolet-visible (UV–Vis) <t>diffuse-reflectance</t> spectrum of BSTON(TN0.2). e Annular dark-field scanning transmission electron microscopy (ADF-STEM) image and the corresponding energy-dispersive X-ray <t>spectroscopy</t> (EDS) elemental maps for synthesized BSTON(TN0.2) solid-solution particles. Source data for Fig. 1b, d are provided as a file.
    Uv Visible Diffuse Reflectance Spectroscopy Drs Data, supplied by JASCO Inc, used in various techniques. Bioz Stars score: 99/100, based on 511 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/diffusion+data/pmc12979620-232-0-13?v=JASCO+Inc
    Average 99 stars, based on 511 article reviews
    uv visible diffuse reflectance spectroscopy drs data - by Bioz Stars, 2026-08
    99/100 stars

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    1) Product Images from "Single-crystalline Ba x Sr 1-x TaO 2 N solid-solution photocatalyst with low defect concentrations for solar-driven water splitting"

    Article Title: Single-crystalline Ba x Sr 1-x TaO 2 N solid-solution photocatalyst with low defect concentrations for solar-driven water splitting

    Journal: Nature Communications

    doi: 10.1038/s41467-026-68848-9

    a Scanning electron microscopy (SEM) image of synthesized BSTON(TN0.2) solid-solution particles. b X-ray diffraction (XRD) pattern for the same sample. c Enlarged view of (110) diffraction peak region. The blue and green bars indicate the (110) peak positions for BaTaO 2 N (JCPDS card No. 40-0566) and SrTaO 2 N (JCPDS card No. 40-0662), respectively. d Ultraviolet-visible (UV–Vis) diffuse-reflectance spectrum of BSTON(TN0.2). e Annular dark-field scanning transmission electron microscopy (ADF-STEM) image and the corresponding energy-dispersive X-ray spectroscopy (EDS) elemental maps for synthesized BSTON(TN0.2) solid-solution particles. Source data for Fig. 1b, d are provided as a file.
    Figure Legend Snippet: a Scanning electron microscopy (SEM) image of synthesized BSTON(TN0.2) solid-solution particles. b X-ray diffraction (XRD) pattern for the same sample. c Enlarged view of (110) diffraction peak region. The blue and green bars indicate the (110) peak positions for BaTaO 2 N (JCPDS card No. 40-0566) and SrTaO 2 N (JCPDS card No. 40-0662), respectively. d Ultraviolet-visible (UV–Vis) diffuse-reflectance spectrum of BSTON(TN0.2). e Annular dark-field scanning transmission electron microscopy (ADF-STEM) image and the corresponding energy-dispersive X-ray spectroscopy (EDS) elemental maps for synthesized BSTON(TN0.2) solid-solution particles. Source data for Fig. 1b, d are provided as a file.

    Techniques Used: Electron Microscopy, Synthesized, Transmission Assay, Spectroscopy



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    a Scanning electron microscopy (SEM) image of synthesized BSTON(TN0.2) solid-solution particles. b X-ray diffraction (XRD) pattern for the same sample. c Enlarged view of (110) diffraction peak region. The blue and green bars indicate the (110) peak positions for BaTaO 2 N (JCPDS card No. 40-0566) and SrTaO 2 N (JCPDS card No. 40-0662), respectively. d Ultraviolet-visible (UV–Vis) <t>diffuse-reflectance</t> spectrum of BSTON(TN0.2). e Annular dark-field scanning transmission electron microscopy (ADF-STEM) image and the corresponding energy-dispersive X-ray <t>spectroscopy</t> (EDS) elemental maps for synthesized BSTON(TN0.2) solid-solution particles. Source data for Fig. 1b, d are provided as a file.
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    a Scanning electron microscopy (SEM) image of synthesized BSTON(TN0.2) solid-solution particles. b X-ray diffraction (XRD) pattern for the same sample. c Enlarged view of (110) diffraction peak region. The blue and green bars indicate the (110) peak positions for BaTaO 2 N (JCPDS card No. 40-0566) and SrTaO 2 N (JCPDS card No. 40-0662), respectively. d Ultraviolet-visible (UV–Vis) <t>diffuse-reflectance</t> spectrum of BSTON(TN0.2). e Annular dark-field scanning transmission electron microscopy (ADF-STEM) image and the corresponding energy-dispersive X-ray <t>spectroscopy</t> (EDS) elemental maps for synthesized BSTON(TN0.2) solid-solution particles. Source data for Fig. 1b, d are provided as a file.
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    Image Search Results


    a Scanning electron microscopy (SEM) image of synthesized BSTON(TN0.2) solid-solution particles. b X-ray diffraction (XRD) pattern for the same sample. c Enlarged view of (110) diffraction peak region. The blue and green bars indicate the (110) peak positions for BaTaO 2 N (JCPDS card No. 40-0566) and SrTaO 2 N (JCPDS card No. 40-0662), respectively. d Ultraviolet-visible (UV–Vis) diffuse-reflectance spectrum of BSTON(TN0.2). e Annular dark-field scanning transmission electron microscopy (ADF-STEM) image and the corresponding energy-dispersive X-ray spectroscopy (EDS) elemental maps for synthesized BSTON(TN0.2) solid-solution particles. Source data for Fig. 1b, d are provided as a file.

    Journal: Nature Communications

    Article Title: Single-crystalline Ba x Sr 1-x TaO 2 N solid-solution photocatalyst with low defect concentrations for solar-driven water splitting

    doi: 10.1038/s41467-026-68848-9

    Figure Lengend Snippet: a Scanning electron microscopy (SEM) image of synthesized BSTON(TN0.2) solid-solution particles. b X-ray diffraction (XRD) pattern for the same sample. c Enlarged view of (110) diffraction peak region. The blue and green bars indicate the (110) peak positions for BaTaO 2 N (JCPDS card No. 40-0566) and SrTaO 2 N (JCPDS card No. 40-0662), respectively. d Ultraviolet-visible (UV–Vis) diffuse-reflectance spectrum of BSTON(TN0.2). e Annular dark-field scanning transmission electron microscopy (ADF-STEM) image and the corresponding energy-dispersive X-ray spectroscopy (EDS) elemental maps for synthesized BSTON(TN0.2) solid-solution particles. Source data for Fig. 1b, d are provided as a file.

    Article Snippet: UV–visible diffuse reflectance spectroscopy (DRS) data were recorded using a UV-visible spectrometer (V-670, JASCO system).

    Techniques: Electron Microscopy, Synthesized, Transmission Assay, Spectroscopy