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absolute diffusion coefficients: compilation reference data fcs calibration  (PicoQuant inc)

 
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    PicoQuant inc absolute diffusion coefficients: compilation reference data fcs calibration
    Absolute Diffusion Coefficients: Compilation Reference Data Fcs Calibration, supplied by PicoQuant inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/diffusion+data/absolute+diffusion+coefficients++compilation+reference+data+fcs+calibration/pm31991501-214-13-15
    Average 90 stars, based on 1 article reviews
    absolute diffusion coefficients: compilation reference data fcs calibration - by Bioz Stars, 2026-11
    90/100 stars

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    Related Articles

    Diffusion-based Assay:

    Article Title: Application of Fluorescence Correlation Spectroscopy in the Characterization of Particle Size Distributions of Colloidal Silica Abrasives Used in Chemical-Mechanical Planarization
    Article Snippet: Particle size distribution (PSD) analysis of colloidal silica abrasives employed in chemical-mechanical planarization slurries is demonstrated using fluorescence correlation spectroscopy (FCS).. FCS allows a quantitative determination of the PSD for a dispersion of abrasive silica particles through fluorescence measurements of a dye, Rhodamine 110 (R110), adsorbed to the particles.. Analysis of the autocorrelation function (ACF) of the fluorescence intensity fluctuations from R110-dyed silica confirms the presence of the adsorbed dye on the particles.

    Article Title: Anomalous diffusion in an electrolyte saturated paper matrix.
    Article Snippet: .. [23] Kapusta, P., Application Note: Absolute Diffusion Coefficients: Compilation of Reference Data for FCS Calibration, PicoQuant GmbH, Berlin 2010. ..



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    a Scanning electron microscopy (SEM) image of synthesized BSTON(TN0.2) solid-solution particles. b X-ray diffraction (XRD) pattern for the same sample. c Enlarged view of (110) diffraction peak region. The blue and green bars indicate the (110) peak positions for BaTaO 2 N (JCPDS card No. 40-0566) and SrTaO 2 N (JCPDS card No. 40-0662), respectively. d Ultraviolet-visible (UV–Vis) diffuse-reflectance spectrum of BSTON(TN0.2). e Annular dark-field scanning transmission electron microscopy (ADF-STEM) image and the corresponding energy-dispersive X-ray spectroscopy (EDS) elemental maps for synthesized BSTON(TN0.2) solid-solution particles. Source data for Fig. 1b, d are provided as a file.

    Journal: Nature Communications

    Article Title: Single-crystalline Ba x Sr 1-x TaO 2 N solid-solution photocatalyst with low defect concentrations for solar-driven water splitting

    doi: 10.1038/s41467-026-68848-9

    Figure Lengend Snippet: a Scanning electron microscopy (SEM) image of synthesized BSTON(TN0.2) solid-solution particles. b X-ray diffraction (XRD) pattern for the same sample. c Enlarged view of (110) diffraction peak region. The blue and green bars indicate the (110) peak positions for BaTaO 2 N (JCPDS card No. 40-0566) and SrTaO 2 N (JCPDS card No. 40-0662), respectively. d Ultraviolet-visible (UV–Vis) diffuse-reflectance spectrum of BSTON(TN0.2). e Annular dark-field scanning transmission electron microscopy (ADF-STEM) image and the corresponding energy-dispersive X-ray spectroscopy (EDS) elemental maps for synthesized BSTON(TN0.2) solid-solution particles. Source data for Fig. 1b, d are provided as a file.

    Article Snippet: UV–visible diffuse reflectance spectroscopy (DRS) data were recorded using a UV-visible spectrometer (V-670, JASCO system).

    Techniques: Electron Microscopy, Synthesized, Transmission Assay, Spectroscopy