rigaku smartlab diffractometer (Rigaku Corporation)

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Rigaku Corporation rigaku smartlab diffractometer
Rigaku Smartlab Diffractometer, supplied by Rigaku Corporation, used in various techniques. Bioz Stars score: 99/100, based on 44094 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/diffractometer/SmartLab/pmc13617754-57-15-15
Average 99 stars, based on 44094 article reviews

rigaku smartlab diffractometer - by Bioz Stars, 2026-10

99/100 stars

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X-ray Diffraction:

Article Title: Targeting the circadian negative regulator period in Bombyx mori : a strategy for improving silk fibroin yield and mechanical properties
Article Snippet: Deconvolution and curve fitting of the amide I band (1600–1700 cm −1 ) were performed using PeakFit software (version 4.12; Systat Software GmbH, Erkrath, Germany). .. XRD patterns were recorded with a SmartLab X-ray diffractometer (Rigaku Corporation, Tokyo, Japan) with Cu Kα radiation, over a 2θ range of 5° to 80° at a scanning rate of 10°/min. ..

Article Title: A Scalable Spin‐Coating Strategy for Mesoporous Gold Thin Films toward miRNA Detection
Article Snippet: Detailed cross‐sectional S/TEM images were obtained using a Hitachi HF5000 operated in TEM and STEM configuration on a lamella sample mounted on a Si grid. .. Crystallographic information for the spin‐coated thin films was recorded using a Rigaku SmartLab XRD instrument with Cu Kα radiation. .. All electrochemical characterizations were performed using CH Instruments in a 3‐electrode configuration with Ag/AgCl (in 3 M saturated KCl solution) reference and Pt wire as the counter electrode.

Article Title: Van der Waals Gap‐Confined Molecular Engineering of MoS 2 for Selectivity‐Enhanced and Humidity‐Tolerant Gas Sensing
Article Snippet: .. To examine changes in the interlayer spacing and crystallographic structure, x‐ray diffraction (XRD) analysis was conducted using a SmartLab diffractometer (Rigaku) with Cu Kα radiation (λ = 0.15412 nm). .. The interlayer spacing was calculated using Bragg's law ( n λ = 2d sin(θ) ), where d is the spacing between adjacent layers, λ is the x‐ray wavelength, and θ is the diffraction angle.

Article Title: Electrochemical Investigation of Compatibility Between Chloride‐ and Sulfide‐Based Solid Electrolytes Using Four‐Electrode Cells
Article Snippet: .. XRD measurements were performed using an X‐ray diffractometer (SmartLab, Rigaku) with Cu Kα1 radiation. ..

Article Title: Overcoming Out-of-Plane Conduction by Changing Nanosheet Morphology.
Article Snippet: HAADF-STEM images and TEM–EDS data ere obtained using a JEM-ARM200F NEOARM (JEOL). .. XRD ata of Li MM ′ O6 powders, H MM ′ O6 powders, TBA/ MM ′ O6 and MM ′ O6 membranes were examined by a SmartLab diffractomeer (Rigaku) with Cu K α radiation. .. XPS spectra of H MM ′ O6 embranes were measured with an x-ray photoelectron specrometer PHI GENESIS (ULVAC-PHI, INCORPORATED).

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other:

Article Title: Multi-biomimetic poly(amino acid)-based Janus membrane integrating barrier and osteoinductive functions for cranial bone regeneration
Article Snippet: Crystalline structures of the samples were characterized by X-ray diffraction (XRD, SmartLab, Rigaku Corporation, Japan) using Cu Kα radiation (λ = 1.5406 Å).

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