Review



b subwavelength diffractive optical elements  (Coherent Corp)


Bioz Verified Symbol Coherent Corp is a verified supplier
Bioz Manufacturer Symbol Coherent Corp manufactures this product  
  • Logo
  • About
  • News
  • Press Release
  • Team
  • Advisors
  • Partners
  • Contact
  • Bioz Stars
  • Bioz vStars
  • 91

    Structured Review

    Coherent Corp b subwavelength diffractive optical elements
    Figure 1. Fast (black) and slow (orange) axis of the <t>subwavelength</t> gratings for generation of different order (n = 1, 2, 3) cylindrical vector beams.
    B Subwavelength Diffractive Optical Elements, supplied by Coherent Corp, used in various techniques. Bioz Stars score: 91/100, based on 8 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/diffraction/DIFFRACTIVE+OPTICAL+ELEMENTS/pm36772619-4-16-25
    Average 91 stars, based on 8 article reviews
    b subwavelength diffractive optical elements - by Bioz Stars, 2026-10
    91/100 stars

    Images

    1) Product Images from "Subwavelength Diffractive Optical Elements for Generation of Terahertz Coherent Beams with Pre-Given Polarization State."

    Article Title: Subwavelength Diffractive Optical Elements for Generation of Terahertz Coherent Beams with Pre-Given Polarization State.

    Journal: Sensors (Basel, Switzerland)

    doi: 10.3390/s23031579

    Figure 1. Fast (black) and slow (orange) axis of the subwavelength gratings for generation of different order (n = 1, 2, 3) cylindrical vector beams.
    Figure Legend Snippet: Figure 1. Fast (black) and slow (orange) axis of the subwavelength gratings for generation of different order (n = 1, 2, 3) cylindrical vector beams.

    Techniques Used: Plasmid Preparation

    Figure 3 shows the dependence of maxima values of the x-component of the horizontal and vertical pairs, as well as the values of the maximum of the y-component on the height of the relief of the subwavelength grating. The amplitudes shown in Figure 3 have absolute values and are not normalized. According to the dynamics of these graphs, it can be seen that initially, most of the energy is contained in the X-component. This is expected because the original field is X-polarized. Increasing the height of the relief to 37 microns allows us to slightly increase the energy in the Y-component by reducing it in the X-component. However, this leaves an asymmetry in the structure of the X-components (see the first row of Table 1). Therefore, we considered a further increase in the relief height to 50 microns, where, firstly, the intersection of three graphs is observed, and, secondly, a symmetrical structure in both transverse components (see the second row of Table 1). We believe that this situation corresponds to the formation of a second-order radial polarization. Unfortunately, in this case, a significant part of the energy is lost, which is scattered on a diffraction structure with high relief.
    Figure Legend Snippet: Figure 3 shows the dependence of maxima values of the x-component of the horizontal and vertical pairs, as well as the values of the maximum of the y-component on the height of the relief of the subwavelength grating. The amplitudes shown in Figure 3 have absolute values and are not normalized. According to the dynamics of these graphs, it can be seen that initially, most of the energy is contained in the X-component. This is expected because the original field is X-polarized. Increasing the height of the relief to 37 microns allows us to slightly increase the energy in the Y-component by reducing it in the X-component. However, this leaves an asymmetry in the structure of the X-components (see the first row of Table 1). Therefore, we considered a further increase in the relief height to 50 microns, where, firstly, the intersection of three graphs is observed, and, secondly, a symmetrical structure in both transverse components (see the second row of Table 1). We believe that this situation corresponds to the formation of a second-order radial polarization. Unfortunately, in this case, a significant part of the energy is lost, which is scattered on a diffraction structure with high relief.

    Techniques Used:

    Figure 3. Dependence of the values of the maxima of the x-component of the horizontal (red line) and vertical (black line) pairs, as well as the values of the maximum of the y-component (blue line) on the elevation of the subwavelength grating.
    Figure Legend Snippet: Figure 3. Dependence of the values of the maxima of the x-component of the horizontal (red line) and vertical (black line) pairs, as well as the values of the maximum of the y-component (blue line) on the elevation of the subwavelength grating.

    Techniques Used:

    Figure 4. Central zones of subwavelength elements (a–c) and expected distributions of local polarization (d–f). Radiation polarized along x-axis is incident on elements normally to the plane of the figure.
    Figure Legend Snippet: Figure 4. Central zones of subwavelength elements (a–c) and expected distributions of local polarization (d–f). Radiation polarized along x-axis is incident on elements normally to the plane of the figure.

    Techniques Used:

    Figure 3 shows that the three lines intersect at a relief height of 50 microns. We will choose this height for the following manufacturing of the element. The subwavelength elements have been designed by methods based on the rigorous light theory [64]. The following DOE parameters were chosen: the aperture diameter D = 50 mm, discretization step s = 10 µm, and wavelength λ = 141 µm. Figure 4a–c shows the calculated binary subwavelength microrelief of meta-axicons for generating terahertz beams with radial polarization of the first, second, and third orders, respectively. Also, the meta-axicons add a focusing phase to the beam (NA = 0.3). In neighboring ring- shaped Fresnel zones, subwavelength grating ridges are perpendicular to each other that provide a focusing phase in the output beam. Figure 4d–f presents the pre-given transverse distribution of the beams (red color for horizontal polarization and green color for vertical polarization).
    Figure Legend Snippet: Figure 3 shows that the three lines intersect at a relief height of 50 microns. We will choose this height for the following manufacturing of the element. The subwavelength elements have been designed by methods based on the rigorous light theory [64]. The following DOE parameters were chosen: the aperture diameter D = 50 mm, discretization step s = 10 µm, and wavelength λ = 141 µm. Figure 4a–c shows the calculated binary subwavelength microrelief of meta-axicons for generating terahertz beams with radial polarization of the first, second, and third orders, respectively. Also, the meta-axicons add a focusing phase to the beam (NA = 0.3). In neighboring ring- shaped Fresnel zones, subwavelength grating ridges are perpendicular to each other that provide a focusing phase in the output beam. Figure 4d–f presents the pre-given transverse distribution of the beams (red color for horizontal polarization and green color for vertical polarization).

    Techniques Used:

    Figure 5. Calculated amplitude distributions at a distance of 5 wavelengths from the plane of the subwavelength elements with different polarization orders: for MAx1 (a), MAx2 (b), and MAx3 (c).
    Figure Legend Snippet: Figure 5. Calculated amplitude distributions at a distance of 5 wavelengths from the plane of the subwavelength elements with different polarization orders: for MAx1 (a), MAx2 (b), and MAx3 (c).

    Techniques Used:

    Related Articles

    Imaging:

    Article Title: Subject Index for Volume 11
    Article Snippet: .. Anomalous behaviors of the Fraunhofer diffraction patterns for a class of partially coherent light, 339 Coherent X-ray diffractive imaging: applications and limitations, 2344 Design of the diffractive optical elements for synthetic spectra, 1392 Nonparaxial analysis of far-field properties of Gaussian beams diffracted at a circular aperture, 1474 ..

    other:

    Article Title: Subwavelength Diffractive Optical Elements for Generation of Terahertz Coherent Beams with Pre-Given Polarization State.
    Article Snippet: Citation: Pavelyev, V.; Khonina, S.; Degtyarev, S.; Tukmakov, K.; Reshetnikov, A.; Gerasimov, V.; Osintseva, N.; Knyazev, B. Subwavelength Diffractive Optical Elements for Generation of Terahertz Coherent Beams with Pre-Given Polarization State.



    Similar Products

    99
    Rigaku Corporation x ray diffraction
    X Ray Diffraction, supplied by Rigaku Corporation, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/diffraction/MiniFlex/pmc13656410-106-0-3
    Average 99 stars, based on 1 article reviews
    x ray diffraction - by Bioz Stars, 2026-10
    99/100 stars
      Buy from Supplier

    99
    Rigaku Corporation x ray diffraction xrd patterns
    X Ray Diffraction Xrd Patterns, supplied by Rigaku Corporation, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/diffraction/Ultima+IV/pmc13656018-75-0-11
    Average 99 stars, based on 1 article reviews
    x ray diffraction xrd patterns - by Bioz Stars, 2026-10
    99/100 stars
      Buy from Supplier

    99
    Rigaku Corporation grazing incidence x ray diffraction
    Grazing Incidence X Ray Diffraction, supplied by Rigaku Corporation, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/diffraction/Ultima+IV/pm42844409-490-16-22
    Average 99 stars, based on 1 article reviews
    grazing incidence x ray diffraction - by Bioz Stars, 2026-10
    99/100 stars
      Buy from Supplier

    99
    Rigaku Corporation x ray diffraction xrd analysis
    Structural, chemical, and electronic modulation in MoS 2 films induced by vdW‐gap molecular confinement. (a) Schematic of the molecule‐confined MoS 2 structure, illustrating the insertion of molecules within the vdW gap. <t>(b)</t> <t>X‐ray</t> <t>diffraction</t> patterns of H 2 O‐MoS 2 and EtOH‐MoS 2 films under different annealing temperatures (RT, 200°C, and 300°C), showing the molecule‐dependent evolution of interlayer spacing. (c) Temperature‐dependent phase transition of EtOH‐MoS 2 from 1T to 2H, identified by Mo 3d XPS spectra. (d) C 1s XPS spectra revealing the presence and chemical state of confined molecules. (e) Surface potential variation measured by KPFM as a function of annealing temperature, showing thermally activated electronic modulation. (f) Work function changes of H 2 O‐ and EtOH‐ MoS 2 films after annealing at 200°C, demonstrating an upward Fermi‐level shift and the associated electron doping effect.
    X Ray Diffraction Xrd Analysis, supplied by Rigaku Corporation, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/diffraction/SmartLab/pmc13650019-228-10-20
    Average 99 stars, based on 1 article reviews
    x ray diffraction xrd analysis - by Bioz Stars, 2026-10
    99/100 stars
      Buy from Supplier

    99
    Rigaku Corporation smart lab x ray diffraction xrd system
    Structural, chemical, and electronic modulation in MoS 2 films induced by vdW‐gap molecular confinement. (a) Schematic of the molecule‐confined MoS 2 structure, illustrating the insertion of molecules within the vdW gap. <t>(b)</t> <t>X‐ray</t> <t>diffraction</t> patterns of H 2 O‐MoS 2 and EtOH‐MoS 2 films under different annealing temperatures (RT, 200°C, and 300°C), showing the molecule‐dependent evolution of interlayer spacing. (c) Temperature‐dependent phase transition of EtOH‐MoS 2 from 1T to 2H, identified by Mo 3d XPS spectra. (d) C 1s XPS spectra revealing the presence and chemical state of confined molecules. (e) Surface potential variation measured by KPFM as a function of annealing temperature, showing thermally activated electronic modulation. (f) Work function changes of H 2 O‐ and EtOH‐ MoS 2 films after annealing at 200°C, demonstrating an upward Fermi‐level shift and the associated electron doping effect.
    Smart Lab X Ray Diffraction Xrd System, supplied by Rigaku Corporation, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/diffraction/SmartLab/10__1007_slash_s43994___026___00321___1-57-17-16
    Average 99 stars, based on 1 article reviews
    smart lab x ray diffraction xrd system - by Bioz Stars, 2026-10
    99/100 stars
      Buy from Supplier

    97
    HORIBA Ltd la 960 laser diffraction analyzer
    Structural, chemical, and electronic modulation in MoS 2 films induced by vdW‐gap molecular confinement. (a) Schematic of the molecule‐confined MoS 2 structure, illustrating the insertion of molecules within the vdW gap. <t>(b)</t> <t>X‐ray</t> <t>diffraction</t> patterns of H 2 O‐MoS 2 and EtOH‐MoS 2 films under different annealing temperatures (RT, 200°C, and 300°C), showing the molecule‐dependent evolution of interlayer spacing. (c) Temperature‐dependent phase transition of EtOH‐MoS 2 from 1T to 2H, identified by Mo 3d XPS spectra. (d) C 1s XPS spectra revealing the presence and chemical state of confined molecules. (e) Surface potential variation measured by KPFM as a function of annealing temperature, showing thermally activated electronic modulation. (f) Work function changes of H 2 O‐ and EtOH‐ MoS 2 films after annealing at 200°C, demonstrating an upward Fermi‐level shift and the associated electron doping effect.
    La 960 Laser Diffraction Analyzer, supplied by HORIBA Ltd, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/diffraction/Partica+LA-960/pm42543106-64-11-10
    Average 97 stars, based on 1 article reviews
    la 960 laser diffraction analyzer - by Bioz Stars, 2026-10
    97/100 stars
      Buy from Supplier

    99
    Rigaku Corporation powder x ray diffraction
    Structural, chemical, and electronic modulation in MoS 2 films induced by vdW‐gap molecular confinement. (a) Schematic of the molecule‐confined MoS 2 structure, illustrating the insertion of molecules within the vdW gap. <t>(b)</t> <t>X‐ray</t> <t>diffraction</t> patterns of H 2 O‐MoS 2 and EtOH‐MoS 2 films under different annealing temperatures (RT, 200°C, and 300°C), showing the molecule‐dependent evolution of interlayer spacing. (c) Temperature‐dependent phase transition of EtOH‐MoS 2 from 1T to 2H, identified by Mo 3d XPS spectra. (d) C 1s XPS spectra revealing the presence and chemical state of confined molecules. (e) Surface potential variation measured by KPFM as a function of annealing temperature, showing thermally activated electronic modulation. (f) Work function changes of H 2 O‐ and EtOH‐ MoS 2 films after annealing at 200°C, demonstrating an upward Fermi‐level shift and the associated electron doping effect.
    Powder X Ray Diffraction, supplied by Rigaku Corporation, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/diffraction/SmartLab/10__1016_slash_j__mtphys__2026__102251-106-0-16
    Average 99 stars, based on 1 article reviews
    powder x ray diffraction - by Bioz Stars, 2026-10
    99/100 stars
      Buy from Supplier

    99
    Rigaku Corporation xray diffraction
    Structural, chemical, and electronic modulation in MoS 2 films induced by vdW‐gap molecular confinement. (a) Schematic of the molecule‐confined MoS 2 structure, illustrating the insertion of molecules within the vdW gap. <t>(b)</t> <t>X‐ray</t> <t>diffraction</t> patterns of H 2 O‐MoS 2 and EtOH‐MoS 2 films under different annealing temperatures (RT, 200°C, and 300°C), showing the molecule‐dependent evolution of interlayer spacing. (c) Temperature‐dependent phase transition of EtOH‐MoS 2 from 1T to 2H, identified by Mo 3d XPS spectra. (d) C 1s XPS spectra revealing the presence and chemical state of confined molecules. (e) Surface potential variation measured by KPFM as a function of annealing temperature, showing thermally activated electronic modulation. (f) Work function changes of H 2 O‐ and EtOH‐ MoS 2 films after annealing at 200°C, demonstrating an upward Fermi‐level shift and the associated electron doping effect.
    Xray Diffraction, supplied by Rigaku Corporation, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/diffraction/SmartLab/10__1016_slash_j__apsusc__2026__168566-86-10-13
    Average 99 stars, based on 1 article reviews
    xray diffraction - by Bioz Stars, 2026-10
    99/100 stars
      Buy from Supplier

    99
    Malvern Panalytical laser diffraction
    Structural, chemical, and electronic modulation in MoS 2 films induced by vdW‐gap molecular confinement. (a) Schematic of the molecule‐confined MoS 2 structure, illustrating the insertion of molecules within the vdW gap. <t>(b)</t> <t>X‐ray</t> <t>diffraction</t> patterns of H 2 O‐MoS 2 and EtOH‐MoS 2 films under different annealing temperatures (RT, 200°C, and 300°C), showing the molecule‐dependent evolution of interlayer spacing. (c) Temperature‐dependent phase transition of EtOH‐MoS 2 from 1T to 2H, identified by Mo 3d XPS spectra. (d) C 1s XPS spectra revealing the presence and chemical state of confined molecules. (e) Surface potential variation measured by KPFM as a function of annealing temperature, showing thermally activated electronic modulation. (f) Work function changes of H 2 O‐ and EtOH‐ MoS 2 films after annealing at 200°C, demonstrating an upward Fermi‐level shift and the associated electron doping effect.
    Laser Diffraction, supplied by Malvern Panalytical, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/diffraction/Mastersizer+3000%2B/pm42826699-133-5-7
    Average 99 stars, based on 1 article reviews
    laser diffraction - by Bioz Stars, 2026-10
    99/100 stars
      Buy from Supplier

    Image Search Results


    Structural, chemical, and electronic modulation in MoS 2 films induced by vdW‐gap molecular confinement. (a) Schematic of the molecule‐confined MoS 2 structure, illustrating the insertion of molecules within the vdW gap. (b) X‐ray diffraction patterns of H 2 O‐MoS 2 and EtOH‐MoS 2 films under different annealing temperatures (RT, 200°C, and 300°C), showing the molecule‐dependent evolution of interlayer spacing. (c) Temperature‐dependent phase transition of EtOH‐MoS 2 from 1T to 2H, identified by Mo 3d XPS spectra. (d) C 1s XPS spectra revealing the presence and chemical state of confined molecules. (e) Surface potential variation measured by KPFM as a function of annealing temperature, showing thermally activated electronic modulation. (f) Work function changes of H 2 O‐ and EtOH‐ MoS 2 films after annealing at 200°C, demonstrating an upward Fermi‐level shift and the associated electron doping effect.

    Journal: Advanced Science

    Article Title: Van der Waals Gap‐Confined Molecular Engineering of MoS 2 for Selectivity‐Enhanced and Humidity‐Tolerant Gas Sensing

    doi: 10.1002/advs.78072

    Figure Lengend Snippet: Structural, chemical, and electronic modulation in MoS 2 films induced by vdW‐gap molecular confinement. (a) Schematic of the molecule‐confined MoS 2 structure, illustrating the insertion of molecules within the vdW gap. (b) X‐ray diffraction patterns of H 2 O‐MoS 2 and EtOH‐MoS 2 films under different annealing temperatures (RT, 200°C, and 300°C), showing the molecule‐dependent evolution of interlayer spacing. (c) Temperature‐dependent phase transition of EtOH‐MoS 2 from 1T to 2H, identified by Mo 3d XPS spectra. (d) C 1s XPS spectra revealing the presence and chemical state of confined molecules. (e) Surface potential variation measured by KPFM as a function of annealing temperature, showing thermally activated electronic modulation. (f) Work function changes of H 2 O‐ and EtOH‐ MoS 2 films after annealing at 200°C, demonstrating an upward Fermi‐level shift and the associated electron doping effect.

    Article Snippet: To examine changes in the interlayer spacing and crystallographic structure, x‐ray diffraction (XRD) analysis was conducted using a SmartLab diffractometer (Rigaku) with Cu Kα radiation (λ = 0.15412 nm).

    Techniques: Sublimation