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fourier mask  (Gatan Inc)


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    Gatan Inc fourier mask
    Fourier Mask, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 79 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/algorithm+digitalmicrograph+gatan+microscope+alignment/Clarity/pmc05099683-81-5-9
    Average 96 stars, based on 79 article reviews
    fourier mask - by Bioz Stars, 2026-11
    96/100 stars

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    Related Articles

    Transmission Assay:

    Article Title: Electrochemically-driven formation of Intermetallic Cu3ZnLi2 alters Li-transport in nanostructured bimetallic battery anode
    Article Snippet: .. The instrument was equipped with an EDAX Clarity direction electron detector (DED) for both Electron Backscatter Diffraction (EBSD) and Transmission Kikuchi Diffraction (TKD) (EDAX Inc., Pleasanton, CA, USA) running APEX and OIM 9.1 (beta). .. Transfers of Li-plated specimens under ultra-high vacuum (UHV) and/or cryogenic conditions to and from the system were done with a Ferrovac D-100 UHV cryogenic transfer suitcase (Ferrovac AG, Zurich, Switzerland), hereafter “suitcase”.

    Article Title: Formation mechanism of white etching area and its evolutionary correlation with crack in Cr5 backup roll steel under rolling contact fatigue
    Article Snippet: White etching areas (WEAs) represent unique strain-driven microstructural modifications formed in material subsurface under rolling contact fatigue (RCF), coupled with intricate physical processes including carbide dissolution, crack surface friction, and reverse martensitic transformation.. Although extensive efforts have been devoted to WEAs over decades, their intrinsic formation mechanisms, causal interplay with cracks, and hardness evolution behavior remain poorly understood and controversial.. Herein, we conduct a multi-scale characterization combining OM, SEM, EPMA, TEM and TKD to systematically investigate WEAs triggered by Al2O3 inclusions in Cr5 backup roll steel, with emphasis on microstructural evolution, elemental redistribution after carbide dissolution, reverse martensitic transformation, hardening origins, and WEA–crack correlation.

    Article Title: Vacuum dealloyed brass as Li-metal battery current collector: Effect of zinc and porosity
    Article Snippet: .. Transmission Kikuchi Diffraction (TKD) was performed using an EDAX Clarity Direct Electron Detector (EDAX LLC, Pleasanton, CA, USA) attached to a dual-beam Thermo Fisher (TF) Helios G5 Ga Focused Ion Beam (FIB) / Scanning Electron Microscope (SEM) (Thermo Fisher Scientific, Eindhoven, Netherlands) and analyzed with EDAX OIM 9.0 Electron Backscatter Diffraction (EBSD) software (9.1.0.85 or later, beta versions). .. Transmission Kikuchi Diffraction (TKD) was performed using an EDAX Clarity Direct Electron Detector (EDAX LLC, Pleasanton, CA, USA) attached to a dual-beam Thermo Fisher (TF) Helios G5 Ga Focused Ion Beam (FIB) / Scanning Electron Microscope (SEM) (Thermo Fisher Scientific, Eindhoven, Netherlands) and analyzed with EDAX OIM 9.0 Electron Backscatter Diffraction (EBSD) software (9.1.0.85 or later, beta versions).

    other:

    Article Title: Mechanically driven Li dendrite penetration in garnet solid electrolyte.
    Article Snippet: EBSD patterns of the LLZTO pellet were collected at cryogenic temperature (−190 °C) using a direct electron detector (Clarity Plus, EDAX LLC).

    Article Title: Mechanically driven Li dendrite penetration in garnet solid electrolyte
    Article Snippet: EBSD patterns of the LLZTO pellet were collected at cryogenic temperature (−190 °C) using a direct electron detector (Clarity Plus, EDAX LLC).

    Article Title: Chelator-engineered nano-electroless copper coatings on epoxides: surface and electrochemical properties.
    Article Snippet: The shape and elemental content of the surface coating were investigated using a JEOL JSM 6390 SEM fitted with an Oxford Instruments EDAX detector.

    Binding Assay:

    Article Title: Surface-specific performance of metal and metal oxide nanoparticles in latent fingerprint visualisation
    Article Snippet: Flores et al. [ ] , Non-porous: foil, stainless steel, glass Porous: wood, hard plastic , Precipitation: 17.2 ± 10.8 nm (hemi-spherical) Combustion: 73.4 ± 6 nm (square) , Level I–III on metal/glass; failed on wood; faint on plastic , Powder dusting + UV , XRD, SEM–EDS, TEM, SAED, Raman, PL, UV–Vis , Phase-pure ZnO; green-orange PL; amino acid binding (7 kJ/mol); Zn:O ~ 1.0; better contrast with combustion NPs on black surfaces , Precipitation better for aluminum; combustion better for black glass; poor on porous substrates. .. Madhavan et al. [ ] , Porous: A4 paper Non-porous: glass , Irregular to spherical Fe2O3 NPs (UIO & AIO); enhanced crystallinity with annealing , High clarity on porous (paper), sharp ridge detail; lower contrast on glass , Powder dusting , XRD, SEM, EDAX , Rhombohedral Fe2O3 phase; high crystallinity (AIO > UIO); elemental purity (Fe, O); homogeneous morphology , AIO performed better than UIO; strong binding to amino acids, lipids, uric acid; hydrogen bonding & van der Waals critical for adhesion. .. Singh et al. [ ] , Porous: paper Non-porous: glass , Spherical, monodispersed γ-Fe2O3; mesoporous; magnetically separable , Very high ridge clarity; long-term (3 months) persistence; superior to commercial powders , Powder dusting , XRD, TEM, SAED, BET, VSM, XPS, FTIR, UV–Vis , γ-Fe2O3 phase (JCPDS 39–1346, 75–0033); 55–65 nm size; pore size 2–60 nm; surface area 20 m 2 /g; Fe 3 + (XPS); Fe–O stretch at 580 cm− 1 ; visible light absorption (UV–Vis) , High contrast on both substrates; enhanced interaction via CTAB (quaternary ammonium); magnetically recoverable; no reported limitations.

    Electron Microscopy:

    Article Title: Enhancing Mechanical and Tribological Properties of Tungsten Carbide via Dynamic Sinter Forging at Varied Oscillating Frequency
    Article Snippet: 1.—Key Laboratory of Advanced Technologies of Materials, Ministry of Education, School of Materials Science and Engineering, Southwest Jiaotong University, Chengdu 610031, China.. 2.—Advanced Structural Materials Mechanical Behavior and Service Safety Key Laboratory of Sichuan Province, Southwest Jiaotong University, Chengdu 610031, China.. 3.—School of Mechanics and Aerospace Engineering, Southwest Jiaotong University, Chengdu 610031, China.

    Microscopy:

    Article Title: Vacuum dealloyed brass as Li-metal battery current collector: Effect of zinc and porosity
    Article Snippet: .. Transmission Kikuchi Diffraction (TKD) was performed using an EDAX Clarity Direct Electron Detector (EDAX LLC, Pleasanton, CA, USA) attached to a dual-beam Thermo Fisher (TF) Helios G5 Ga Focused Ion Beam (FIB) / Scanning Electron Microscope (SEM) (Thermo Fisher Scientific, Eindhoven, Netherlands) and analyzed with EDAX OIM 9.0 Electron Backscatter Diffraction (EBSD) software (9.1.0.85 or later, beta versions). .. Transmission Kikuchi Diffraction (TKD) was performed using an EDAX Clarity Direct Electron Detector (EDAX LLC, Pleasanton, CA, USA) attached to a dual-beam Thermo Fisher (TF) Helios G5 Ga Focused Ion Beam (FIB) / Scanning Electron Microscope (SEM) (Thermo Fisher Scientific, Eindhoven, Netherlands) and analyzed with EDAX OIM 9.0 Electron Backscatter Diffraction (EBSD) software (9.1.0.85 or later, beta versions).

    Software:

    Article Title: Vacuum dealloyed brass as Li-metal battery current collector: Effect of zinc and porosity
    Article Snippet: .. Transmission Kikuchi Diffraction (TKD) was performed using an EDAX Clarity Direct Electron Detector (EDAX LLC, Pleasanton, CA, USA) attached to a dual-beam Thermo Fisher (TF) Helios G5 Ga Focused Ion Beam (FIB) / Scanning Electron Microscope (SEM) (Thermo Fisher Scientific, Eindhoven, Netherlands) and analyzed with EDAX OIM 9.0 Electron Backscatter Diffraction (EBSD) software (9.1.0.85 or later, beta versions). .. Transmission Kikuchi Diffraction (TKD) was performed using an EDAX Clarity Direct Electron Detector (EDAX LLC, Pleasanton, CA, USA) attached to a dual-beam Thermo Fisher (TF) Helios G5 Ga Focused Ion Beam (FIB) / Scanning Electron Microscope (SEM) (Thermo Fisher Scientific, Eindhoven, Netherlands) and analyzed with EDAX OIM 9.0 Electron Backscatter Diffraction (EBSD) software (9.1.0.85 or later, beta versions).



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    algorithm digitalmicrograph gatan microscope alignment  (Gatan Inc)
    97
    Gatan Inc algorithm digitalmicrograph gatan microscope alignment
    Algorithm Digitalmicrograph Gatan Microscope Alignment, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/algorithm+digitalmicrograph+gatan+microscope+alignment/DigitalMicrograph+Software/10__7554_slash_elife__58464-167-100-102
    Average 97 stars, based on 1 article reviews
    algorithm digitalmicrograph gatan microscope alignment - by Bioz Stars, 2026-11
    97/100 stars
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