afm machine Search Results


mfp 3d afm machine  (Oxford Instruments)
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Oxford Instruments mfp 3d afm machine
Mfp 3d Afm Machine, supplied by Oxford Instruments, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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alpha 300 afm machine  (Witech Co Inc)
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Witech Co Inc alpha 300 afm machine
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multimode 8 afm machine scanasyst-air  (Veeco)
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Veeco multimode 8 afm machine scanasyst-air
Multimode 8 Afm Machine Scanasyst Air, supplied by Veeco, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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afm veeco metrology machine dimultimode v  (Veeco)
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Afm Veeco Metrology Machine Dimultimode V, supplied by Veeco, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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afm machine edge  (Bruker Corporation)
90
Bruker Corporation afm machine edge
Afm Machine Edge, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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afm machines  (MikroMasch Inc)
90
MikroMasch Inc afm machines
Afm Machines, supplied by MikroMasch Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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afm machine nanosurf flex (version 5)  (Nanosurf Inc)
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Nanosurf Inc afm machine nanosurf flex (version 5)
Afm Machine Nanosurf Flex (Version 5), supplied by Nanosurf Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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atomic force microscope nanoman/multimode8 afm machine  (Nanoman Industries)
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Nanoman Industries atomic force microscope nanoman/multimode8 afm machine
Atomic Force Microscope Nanoman/Multimode8 Afm Machine, supplied by Nanoman Industries, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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atomic force microscopy machine nanoscope v dimension icon/fastscan afm  (Bruker Corporation)
90
Bruker Corporation atomic force microscopy machine nanoscope v dimension icon/fastscan afm
Atomic Force <t>Microscopy</t> <t>(AFM)</t> images of a PVA quadlayer coating. The cross section scanned at low (A) and high (B) magnification illustrates the layered structure of the coating.
Atomic Force Microscopy Machine Nanoscope V Dimension Icon/Fastscan Afm, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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afm machines with increased scanning speed bruker fastscantm  (Bruker Corporation)
90
Bruker Corporation afm machines with increased scanning speed bruker fastscantm
Atomic Force <t>Microscopy</t> <t>(AFM)</t> images of a PVA quadlayer coating. The cross section scanned at low (A) and high (B) magnification illustrates the layered structure of the coating.
Afm Machines With Increased Scanning Speed Bruker Fastscantm, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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multimode® 8 afm machine scanasyst-air  (Bruker Corporation)
90
Bruker Corporation multimode® 8 afm machine scanasyst-air
Atomic Force <t>Microscopy</t> <t>(AFM)</t> images of a PVA quadlayer coating. The cross section scanned at low (A) and high (B) magnification illustrates the layered structure of the coating.
Multimode® 8 Afm Machine Scanasyst Air, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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atomic force machine naio afm  (Nanosurf Inc)
90
Nanosurf Inc atomic force machine naio afm
<t>AFM</t> Images of MTA in Two Views of 3D Images (a1-d1) <t>and</t> <t>Topographical</t> Micrographs (a2-d2). Bright and dark areas indicate height and depth respectively. a1 and a2) non-etch surface, relatively flat and uniform surface. b1 and b2) 5s acid etch surface, more irregularities. c1 and c2) 15s acid etch surface, micro retentive appearance as a number of concavities and convexities. d1 and d2) laser etch, valley-like appearance full of peaks and valleys.
Atomic Force Machine Naio Afm, supplied by Nanosurf Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Image Search Results


Atomic Force Microscopy (AFM) images of a PVA quadlayer coating. The cross section scanned at low (A) and high (B) magnification illustrates the layered structure of the coating.

Journal: RSC Advances

Article Title: Effect of nanoclay orientation on oxygen barrier properties of LbL nanocomposite coated films †

doi: 10.1039/c8ra09522a

Figure Lengend Snippet: Atomic Force Microscopy (AFM) images of a PVA quadlayer coating. The cross section scanned at low (A) and high (B) magnification illustrates the layered structure of the coating.

Article Snippet: The morphology of the cross-section of coated layers was then examined using an Atomic Force Microscopy (AFM) machine (Nanoscope V Dimension Icon/Fastscan AFM, Bruker, USA) operated in tapping mode in air.

Techniques: Microscopy

AFM Images of MTA in Two Views of 3D Images (a1-d1) and Topographical Micrographs (a2-d2). Bright and dark areas indicate height and depth respectively. a1 and a2) non-etch surface, relatively flat and uniform surface. b1 and b2) 5s acid etch surface, more irregularities. c1 and c2) 15s acid etch surface, micro retentive appearance as a number of concavities and convexities. d1 and d2) laser etch, valley-like appearance full of peaks and valleys.

Journal: Journal of Lasers in Medical Sciences

Article Title: Effect of Er:YAG Laser and Reduced Time of Acid Etching on Bond Strength of Self-adhesive Resin Cement to MTA and Biodentine

doi: 10.34172/jlms.2021.36

Figure Lengend Snippet: AFM Images of MTA in Two Views of 3D Images (a1-d1) and Topographical Micrographs (a2-d2). Bright and dark areas indicate height and depth respectively. a1 and a2) non-etch surface, relatively flat and uniform surface. b1 and b2) 5s acid etch surface, more irregularities. c1 and c2) 15s acid etch surface, micro retentive appearance as a number of concavities and convexities. d1 and d2) laser etch, valley-like appearance full of peaks and valleys.

Article Snippet: In order to observe topographical features, the sample surfaces were scanned with an atomic force machine (AFM) (Naio AFM, NanoSurf, Switzerland) via a sharp silicon cantilever (Tap150Al-G, Budget Sensor, Bulgaria) in a dynamic non-contact mode, with the resonance frequency of 160 kHz and stiffness constant of 0.2 N/m.

Techniques:

AFM Images of Biodentine in Two Views of 3D Images (a1-d1) and topographical Micrographs (a2-d2). Bright and dark areas indicate height and depth respectively. a1 and a2) non-etch surface, relatively flat and uniform surface. b1 and b2) 5s acid etch surface. c1 and c2) 15s acid-etch surface, micro-retentive appearance as a number of concavities and convexities. d1 and d2) laser etch, more irregularities.

Journal: Journal of Lasers in Medical Sciences

Article Title: Effect of Er:YAG Laser and Reduced Time of Acid Etching on Bond Strength of Self-adhesive Resin Cement to MTA and Biodentine

doi: 10.34172/jlms.2021.36

Figure Lengend Snippet: AFM Images of Biodentine in Two Views of 3D Images (a1-d1) and topographical Micrographs (a2-d2). Bright and dark areas indicate height and depth respectively. a1 and a2) non-etch surface, relatively flat and uniform surface. b1 and b2) 5s acid etch surface. c1 and c2) 15s acid-etch surface, micro-retentive appearance as a number of concavities and convexities. d1 and d2) laser etch, more irregularities.

Article Snippet: In order to observe topographical features, the sample surfaces were scanned with an atomic force machine (AFM) (Naio AFM, NanoSurf, Switzerland) via a sharp silicon cantilever (Tap150Al-G, Budget Sensor, Bulgaria) in a dynamic non-contact mode, with the resonance frequency of 160 kHz and stiffness constant of 0.2 N/m.

Techniques: