xrd experiment Search Results


90
Millar Inc xrd experiments
Xrd Experiments, supplied by Millar Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Shin Nippon Biomedical combined operando xas-xrd experiment
Combined Operando Xas Xrd Experiment, supplied by Shin Nippon Biomedical, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Brookhaven Instruments high resolution xrd experiments
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Brookhaven Instruments xrd experiments
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Brookhaven Instruments xrd and pdf experiments
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Diamond Light Source Ltd synchrotron xrd experiment
Synchrotron Xrd Experiment, supplied by Diamond Light Source Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Siemens AG xrd experiments
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Shin Nippon Biomedical combined xas (ni k-edge, 8.2 kev)–xrd experiments
Combined in <t>situ</t> <t>XRD–XAS</t> characterization: (a) in situ XRD ( λ = 0.5060 Å), (b) in situ Ni K-edge XANES with NiO and NiAl 2 O 4 references, and (c) corresponding LCF analysis results for Al (4.0 nm)–Ni/SiO 2 during calcination in 20 vol% O 2 /N 2 . The symbols in the diffractogram mark the peaks due to NiO (ICSD 9866, ■) and NiAl 2 O 4 (ICSD 9554, ). The arrows indicate the direction of change in the XANES spectra with increasing calcination temperature.
Combined Xas (Ni K Edge, 8.2 Kev)–Xrd Experiments, supplied by Shin Nippon Biomedical, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Shin Nippon Biomedical xrd experiments
Combined in <t>situ</t> <t>XRD–XAS</t> characterization: (a) in situ XRD ( λ = 0.5060 Å), (b) in situ Ni K-edge XANES with NiO and NiAl 2 O 4 references, and (c) corresponding LCF analysis results for Al (4.0 nm)–Ni/SiO 2 during calcination in 20 vol% O 2 /N 2 . The symbols in the diffractogram mark the peaks due to NiO (ICSD 9866, ■) and NiAl 2 O 4 (ICSD 9554, ). The arrows indicate the direction of change in the XANES spectra with increasing calcination temperature.
Xrd Experiments, supplied by Shin Nippon Biomedical, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Perimed Inc xrd experiments
Combined in <t>situ</t> <t>XRD–XAS</t> characterization: (a) in situ XRD ( λ = 0.5060 Å), (b) in situ Ni K-edge XANES with NiO and NiAl 2 O 4 references, and (c) corresponding LCF analysis results for Al (4.0 nm)–Ni/SiO 2 during calcination in 20 vol% O 2 /N 2 . The symbols in the diffractogram mark the peaks due to NiO (ICSD 9866, ■) and NiAl 2 O 4 (ICSD 9554, ). The arrows indicate the direction of change in the XANES spectra with increasing calcination temperature.
Xrd Experiments, supplied by Perimed Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Brookhaven Instruments angle-dispersive xrd experiments
(a) Typical <t>XRD</t> pattern of <t>the</t> <t>ultrathin</t> InOOH nanowires. (b) Typical TEM image of InOOH nanowires. (c) Typical HRTEM image and the corresponding FFT pattern of an isolated InOOH nanowire. (d) The EDS spectrum of the prepared InOOH nanowires.
Angle Dispersive Xrd Experiments, supplied by Brookhaven Instruments, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Image Search Results


Combined in situ XRD–XAS characterization: (a) in situ XRD ( λ = 0.5060 Å), (b) in situ Ni K-edge XANES with NiO and NiAl 2 O 4 references, and (c) corresponding LCF analysis results for Al (4.0 nm)–Ni/SiO 2 during calcination in 20 vol% O 2 /N 2 . The symbols in the diffractogram mark the peaks due to NiO (ICSD 9866, ■) and NiAl 2 O 4 (ICSD 9554, ). The arrows indicate the direction of change in the XANES spectra with increasing calcination temperature.

Journal: Catalysis Science & Technology

Article Title: Structural insight into an atomic layer deposition (ALD) grown Al 2 O 3 layer on Ni/SiO 2 : impact on catalytic activity and stability in dry reforming of methane †

doi: 10.1039/d1cy01149a

Figure Lengend Snippet: Combined in situ XRD–XAS characterization: (a) in situ XRD ( λ = 0.5060 Å), (b) in situ Ni K-edge XANES with NiO and NiAl 2 O 4 references, and (c) corresponding LCF analysis results for Al (4.0 nm)–Ni/SiO 2 during calcination in 20 vol% O 2 /N 2 . The symbols in the diffractogram mark the peaks due to NiO (ICSD 9866, ■) and NiAl 2 O 4 (ICSD 9554, ). The arrows indicate the direction of change in the XANES spectra with increasing calcination temperature.

Article Snippet: In situ combined XAS (Ni K-edge, 8.2 keV)–XRD experiments were performed at the Swiss-Norwegian Beamlines (SNBL, BM31) at the European Synchrotron Radiation Facility (ESRF).

Techniques: In Situ

(a) Typical XRD pattern of the ultrathin InOOH nanowires. (b) Typical TEM image of InOOH nanowires. (c) Typical HRTEM image and the corresponding FFT pattern of an isolated InOOH nanowire. (d) The EDS spectrum of the prepared InOOH nanowires.

Journal: ACS Omega

Article Title: InOOH Bulk Crystals and Ultrathin Nanowires under Compression

doi: 10.1021/acsomega.0c01088

Figure Lengend Snippet: (a) Typical XRD pattern of the ultrathin InOOH nanowires. (b) Typical TEM image of InOOH nanowires. (c) Typical HRTEM image and the corresponding FFT pattern of an isolated InOOH nanowire. (d) The EDS spectrum of the prepared InOOH nanowires.

Article Snippet: The angle-dispersive XRD experiments of microcrystallites and ultrathin nanowires were performed at the Shanghai Synchrotron Radiation Facility (SSRF) (λ = 0.6199 Å) and the National Synchrotron Light Source (NSLS), the Brookhaven National Laboratory (BNL) (λ = 0.4112 Å), respectively.

Techniques: Isolation

(a) Angle-dispersive XRD patterns of InOOH bulk crystals. (b) Le Bail refinements of the XRD patterns of InOOH bulk crystals at different pressures.

Journal: ACS Omega

Article Title: InOOH Bulk Crystals and Ultrathin Nanowires under Compression

doi: 10.1021/acsomega.0c01088

Figure Lengend Snippet: (a) Angle-dispersive XRD patterns of InOOH bulk crystals. (b) Le Bail refinements of the XRD patterns of InOOH bulk crystals at different pressures.

Article Snippet: The angle-dispersive XRD experiments of microcrystallites and ultrathin nanowires were performed at the Shanghai Synchrotron Radiation Facility (SSRF) (λ = 0.6199 Å) and the National Synchrotron Light Source (NSLS), the Brookhaven National Laboratory (BNL) (λ = 0.4112 Å), respectively.

Techniques:

(a) Angle-dispersive XRD patterns of the InOOH nanowires. The peak of Fe, which is from the stainless steel gasket, is marked with an asterisk. (b) The narrow-range XRD patterns and the deconvoluted peaks of InOOH nanowires (solid blue trace) at 0.9, 15.1, and 35.0 GPa.

Journal: ACS Omega

Article Title: InOOH Bulk Crystals and Ultrathin Nanowires under Compression

doi: 10.1021/acsomega.0c01088

Figure Lengend Snippet: (a) Angle-dispersive XRD patterns of the InOOH nanowires. The peak of Fe, which is from the stainless steel gasket, is marked with an asterisk. (b) The narrow-range XRD patterns and the deconvoluted peaks of InOOH nanowires (solid blue trace) at 0.9, 15.1, and 35.0 GPa.

Article Snippet: The angle-dispersive XRD experiments of microcrystallites and ultrathin nanowires were performed at the Shanghai Synchrotron Radiation Facility (SSRF) (λ = 0.6199 Å) and the National Synchrotron Light Source (NSLS), the Brookhaven National Laboratory (BNL) (λ = 0.4112 Å), respectively.

Techniques: