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Image Search Results
Journal: Materials
Article Title: Evaluation of Dislocation Densities in Various Microstructures of Additively Manufactured Ti6Al4V (Eli) by the Method of X-ray Diffraction
doi: 10.3390/ma13235355
Figure Lengend Snippet: The ( a ) Gaussian and ( b ) Lorentzian FWHM against diffraction vector ( K ) for the five types of the samples with instrumental broadening, referenced against results for a silicon (Si-640d) sample with no instrumental broadening.
Article Snippet: A typical example of the deconvoluted doublet peaks is shown in . shows the trends of the FWHM in nm-1 for the various peaks of the five types of DMLS Ti6Al4V (ELI) microstructures studied here, and that of the
Techniques: Plasmid Preparation