scanning electron microscope (sem) Search Results


philips xl30 feg sem  (Philips Healthcare)
86
Philips Healthcare philips xl30 feg sem
Philips Xl30 Feg Sem, supplied by Philips Healthcare, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+(sem)/electron+microscope+scanning+sem+%EB%AF%B8%EC%84%B8%EC%BA%A1%EC%8A%90%EC%9D%98+%EB%AF%B8%EC%84%B8%EC%BA%A1%EC%8A%90%EC%9D%98+%ED%81%AC%EA%B8%B0%EB%8A%94+%ED%8A%B9%EC%84%B1+%ED%91%9C%EB%A9%B4%EA%B3%BC/10__1021_slash_nl301181u____nl301181u_si_001-13-15-15
Average 86 stars, based on 1 article reviews
philips xl30 feg sem - by Bioz Stars, 2026-08
86/100 stars
  Buy from Supplier
ultrafast scanning electron microscope (sem) based on the optical fiber-integrated graphene ultrafast hot-electron source  (Integrated Graphene)
90
Integrated Graphene ultrafast scanning electron microscope (sem) based on the optical fiber-integrated graphene ultrafast hot-electron source
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Ultrafast Scanning Electron Microscope (Sem) Based On The Optical Fiber Integrated Graphene Ultrafast Hot Electron Source, supplied by Integrated Graphene, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+(sem)/ultrafast+scanning+electron+microscope++sem++based+on+the+optical+fiber+integrated+graphene+ultrafast+hot+electron+source/pmc12219288-115-2-11
Average 90 stars, based on 1 article reviews
ultrafast scanning electron microscope (sem) based on the optical fiber-integrated graphene ultrafast hot-electron source - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier
scanning electron microscope  (Phenom-World ltd)
90
Phenom-World ltd scanning electron microscope
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Scanning Electron Microscope, supplied by Phenom-World ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+(sem)/scanning+electron+microscope++sem/pmc11597501-97-19-22
Average 90 stars, based on 1 article reviews
scanning electron microscope - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier
scanning electron microscope (sem) tescan model vega 3sbu  (TESCAN ORSAY)
90
TESCAN ORSAY scanning electron microscope (sem) tescan model vega 3sbu
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Scanning Electron Microscope (Sem) Tescan Model Vega 3sbu, supplied by TESCAN ORSAY, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+(sem)/scanning+electron+microscope++sem++tescan+model+vega+3sbu/pm38203826-494-25-29
Average 90 stars, based on 1 article reviews
scanning electron microscope (sem) tescan model vega 3sbu - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier
scanning electron microscope aspex 3020 model sirius50/3.8  (Aspex Corporation)
90
Aspex Corporation scanning electron microscope aspex 3020 model sirius50/3.8
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Scanning Electron Microscope Aspex 3020 Model Sirius50/3.8, supplied by Aspex Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+(sem)/scanning+electron+microscope+sem+model+sirius50+3+8/10__15282_slash_ijame__14__1__2017__18__0328-75-21-16
Average 90 stars, based on 1 article reviews
scanning electron microscope aspex 3020 model sirius50/3.8 - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier
scanning electron microscopy sem  (NanoLab Inc)
90
NanoLab Inc scanning electron microscopy sem
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Scanning Electron Microscopy Sem, supplied by NanoLab Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+(sem)/scanning+electron+microscope+sem/pm35590946-168-9-18
Average 90 stars, based on 1 article reviews
scanning electron microscopy sem - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier
scanning electron microscope leco sem  (LECO Corporation)
90
LECO Corporation scanning electron microscope leco sem
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Scanning Electron Microscope Leco Sem, supplied by LECO Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+(sem)/scanning+electron+microscope+leco+sem/pm37391409-212-11-14
Average 90 stars, based on 1 article reviews
scanning electron microscope leco sem - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier
scanning electron microscope sem views of the electronically conductive material (m1), denka carbon  (Denka Co Ltd)
90
Denka Co Ltd scanning electron microscope sem views of the electronically conductive material (m1), denka carbon
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Scanning Electron Microscope Sem Views Of The Electronically Conductive Material (M1), Denka Carbon, supplied by Denka Co Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+(sem)/scanning+electron+microscope+sem+views+of+the+electronically+conductive+material++m1+++denka+carbon/us08333911-215-16-16
Average 90 stars, based on 1 article reviews
scanning electron microscope sem views of the electronically conductive material (m1), denka carbon - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier
era-8000  (ELIONIX INC)
90
ELIONIX INC era-8000
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Era 8000, supplied by ELIONIX INC, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+(sem)/scanning+electron+microscope+sem+era+8000s/us07341635-54-11-14
Average 90 stars, based on 1 article reviews
era-8000 - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier
scanning electron microscope (sem  (EmCrafts Co Ltd)
90
EmCrafts Co Ltd scanning electron microscope (sem
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Scanning Electron Microscope (Sem, supplied by EmCrafts Co Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+(sem)/scanning+electron+microscope++sem/10__1007_slash_s42773___024___00394___3-73-12-23
Average 90 stars, based on 1 article reviews
scanning electron microscope (sem - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier
scanning electron microscope sem  (CAMECA Inc)
90
CAMECA Inc scanning electron microscope sem
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Scanning Electron Microscope Sem, supplied by CAMECA Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+(sem)/scanning+electron+microscope+sem/10__1016_slash_j__quascirev__2024__108810-80-14-33
Average 90 stars, based on 1 article reviews
scanning electron microscope sem - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier
sem analyzer kyky-em3200  (KYKY TECHNOLOGY DEVELOPMENT)
90
KYKY TECHNOLOGY DEVELOPMENT sem analyzer kyky-em3200
a Schematic diagram of our ultrafast SEM. A traditional scanning <t>microscope</t> body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.
Sem Analyzer Kyky Em3200, supplied by KYKY TECHNOLOGY DEVELOPMENT, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+(sem)/scanning+electron+microscope+sem/pmc10740042-101-18-21
Average 90 stars, based on 1 article reviews
sem analyzer kyky-em3200 - by Bioz Stars, 2026-08
90/100 stars
  Buy from Supplier

Image Search Results


a Schematic diagram of our ultrafast SEM. A traditional scanning microscope body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.

Journal: Nature Communications

Article Title: Stable ultrafast graphene hot-electron source on optical fiber

doi: 10.1038/s41467-025-60915-x

Figure Lengend Snippet: a Schematic diagram of our ultrafast SEM. A traditional scanning microscope body is equipped with our optical fiber-integrated graphene ultrafast hot-electron source for spatial and temporal imaging. CL: Cathodoluminescence; TCSPC: Time-correlated single-photon counting; APD: Avalanche photodiode. b Images obtained from the ultrafast electron microscope using a secondary electron detector. High signal-to-background ratio images can be captured when the laser is turned on, benefiting from the pure pulsed electrons from graphene. c CL and far-field PL spectra of CdSe/ZnS quantum dots. d Time-resolved CL and PL spectra (circles) of CdSe/ZnS quantum dots. The exponential decay fitting (solid lines) gives decay lifetimes of CL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{CL}}}}}}$$\end{document} τ CL ) and PL ( \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$${{\tau }}_{{{{{\rm{PL}}}}}}$$\end{document} τ PL ) of 2.5 ns and 2.6 ns, respectively. The optical excitation at 1560 nm is transmitted via optical fiber.

Article Snippet: Fig. 4 Ultrafast scanning electron microscope (SEM) based on the optical fiber-integrated graphene ultrafast hot-electron source. a Schematic diagram of our ultrafast SEM.

Techniques: Microscopy, Imaging