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forescatter electron imaging  (Bruker Corporation)
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Bruker Corporation forescatter electron imaging
Fig. 3. <t>Forescatter</t> diode (FSD) imaging with varying detector tilt. (a) At low detector tilt, contrast is optimised to reveal surface topography, demonstrating black-white contrast (a-i and a-ii) either side of a preferentially polished region of the FCC phase, and objects are located on the top of the surface show the ‘RGB’ plume artefact due to preferential shadowing of electrons for each diode use to form the red, blue, and green diodes. As the detector is tilted towards higher screen positions as compared to the sample (b and c) the topography contrast is suppressed and the orientation contrast between grains and between sub-grains increases. Inserts are of higher magnification regions and examples of raw EBSD patterns are given to indicate the relative position of the detector and the incident electron signal. (For interpretation of the references to colour in this figure legend, the reader is referred to the web version of this article.)
Forescatter Electron Imaging, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Fig. 3. Forescatter diode (FSD) imaging with varying detector tilt. (a) At low detector tilt, contrast is optimised to reveal surface topography, demonstrating black-white contrast (a-i and a-ii) either side of a preferentially polished region of the FCC phase, and objects are located on the top of the surface show the ‘RGB’ plume artefact due to preferential shadowing of electrons for each diode use to form the red, blue, and green diodes. As the detector is tilted towards higher screen positions as compared to the sample (b and c) the topography contrast is suppressed and the orientation contrast between grains and between sub-grains increases. Inserts are of higher magnification regions and examples of raw EBSD patterns are given to indicate the relative position of the detector and the incident electron signal. (For interpretation of the references to colour in this figure legend, the reader is referred to the web version of this article.)

Journal: Materials Characterization

Article Title: Space rocks and optimising scanning electron channelling contrast

doi: 10.1016/j.matchar.2018.06.001

Figure Lengend Snippet: Fig. 3. Forescatter diode (FSD) imaging with varying detector tilt. (a) At low detector tilt, contrast is optimised to reveal surface topography, demonstrating black-white contrast (a-i and a-ii) either side of a preferentially polished region of the FCC phase, and objects are located on the top of the surface show the ‘RGB’ plume artefact due to preferential shadowing of electrons for each diode use to form the red, blue, and green diodes. As the detector is tilted towards higher screen positions as compared to the sample (b and c) the topography contrast is suppressed and the orientation contrast between grains and between sub-grains increases. Inserts are of higher magnification regions and examples of raw EBSD patterns are given to indicate the relative position of the detector and the incident electron signal. (For interpretation of the references to colour in this figure legend, the reader is referred to the web version of this article.)

Article Snippet: Forescatter electron imaging was captured using the ARGUS imaging system, mounted on a Bruker e-Flash FS EBSD detector and EDS data was acquired using a Bruker XFlash 6|60 detector.

Techniques: Imaging

Fig. 4. Forescatter diode (FSD) imaging with varying detector distance. (a) The ‘near’ position has a detector approx. 15 mm from the sample, (b) ‘medium’ at 20 mm, and (c) ‘far’ at 25 mm. Contrast in the near condition is strongly dominated by topography, and the far condition (for this detector tilt) high- lights contrast for the crystal orientation. Inserts are of higher magnification regions and an example EBSD pattern to indicate the relative position of the detector and the incoming electron signal.

Journal: Materials Characterization

Article Title: Space rocks and optimising scanning electron channelling contrast

doi: 10.1016/j.matchar.2018.06.001

Figure Lengend Snippet: Fig. 4. Forescatter diode (FSD) imaging with varying detector distance. (a) The ‘near’ position has a detector approx. 15 mm from the sample, (b) ‘medium’ at 20 mm, and (c) ‘far’ at 25 mm. Contrast in the near condition is strongly dominated by topography, and the far condition (for this detector tilt) high- lights contrast for the crystal orientation. Inserts are of higher magnification regions and an example EBSD pattern to indicate the relative position of the detector and the incoming electron signal.

Article Snippet: Forescatter electron imaging was captured using the ARGUS imaging system, mounted on a Bruker e-Flash FS EBSD detector and EDS data was acquired using a Bruker XFlash 6|60 detector.

Techniques: Imaging