electron backscatter diffraction ebsd Search Results


forescatter electron imaging  (Bruker Corporation)
96
Bruker Corporation forescatter electron imaging
Fig. 3. <t>Forescatter</t> diode (FSD) imaging with varying detector tilt. (a) At low detector tilt, contrast is optimised to reveal surface topography, demonstrating black-white contrast (a-i and a-ii) either side of a preferentially polished region of the FCC phase, and objects are located on the top of the surface show the ‘RGB’ plume artefact due to preferential shadowing of electrons for each diode use to form the red, blue, and green diodes. As the detector is tilted towards higher screen positions as compared to the sample (b and c) the topography contrast is suppressed and the orientation contrast between grains and between sub-grains increases. Inserts are of higher magnification regions and examples of raw EBSD patterns are given to indicate the relative position of the detector and the incident electron signal. (For interpretation of the references to colour in this figure legend, the reader is referred to the web version of this article.)
Forescatter Electron Imaging, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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electron backscatter diffraction  (Bruker Corporation)
95
Bruker Corporation electron backscatter diffraction
Fig. 3. <t>Forescatter</t> diode (FSD) imaging with varying detector tilt. (a) At low detector tilt, contrast is optimised to reveal surface topography, demonstrating black-white contrast (a-i and a-ii) either side of a preferentially polished region of the FCC phase, and objects are located on the top of the surface show the ‘RGB’ plume artefact due to preferential shadowing of electrons for each diode use to form the red, blue, and green diodes. As the detector is tilted towards higher screen positions as compared to the sample (b and c) the topography contrast is suppressed and the orientation contrast between grains and between sub-grains increases. Inserts are of higher magnification regions and examples of raw EBSD patterns are given to indicate the relative position of the detector and the incident electron signal. (For interpretation of the references to colour in this figure legend, the reader is referred to the web version of this article.)
Electron Backscatter Diffraction, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 95/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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electron backscatter diffraction ebsd  (Gatan Inc)
96
Gatan Inc electron backscatter diffraction ebsd
Fig. 3. <t>Forescatter</t> diode (FSD) imaging with varying detector tilt. (a) At low detector tilt, contrast is optimised to reveal surface topography, demonstrating black-white contrast (a-i and a-ii) either side of a preferentially polished region of the FCC phase, and objects are located on the top of the surface show the ‘RGB’ plume artefact due to preferential shadowing of electrons for each diode use to form the red, blue, and green diodes. As the detector is tilted towards higher screen positions as compared to the sample (b and c) the topography contrast is suppressed and the orientation contrast between grains and between sub-grains increases. Inserts are of higher magnification regions and examples of raw EBSD patterns are given to indicate the relative position of the detector and the incident electron signal. (For interpretation of the references to colour in this figure legend, the reader is referred to the web version of this article.)
Electron Backscatter Diffraction Ebsd, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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k2 summit direct electron detector  (Gatan Inc)
96
Gatan Inc k2 summit direct electron detector
Fig. 3. <t>Forescatter</t> diode (FSD) imaging with varying detector tilt. (a) At low detector tilt, contrast is optimised to reveal surface topography, demonstrating black-white contrast (a-i and a-ii) either side of a preferentially polished region of the FCC phase, and objects are located on the top of the surface show the ‘RGB’ plume artefact due to preferential shadowing of electrons for each diode use to form the red, blue, and green diodes. As the detector is tilted towards higher screen positions as compared to the sample (b and c) the topography contrast is suppressed and the orientation contrast between grains and between sub-grains increases. Inserts are of higher magnification regions and examples of raw EBSD patterns are given to indicate the relative position of the detector and the incident electron signal. (For interpretation of the references to colour in this figure legend, the reader is referred to the web version of this article.)
K2 Summit Direct Electron Detector, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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3d ebsd data acquisition  (Gatan Inc)
96
Gatan Inc 3d ebsd data acquisition
Fig. 3. <t>Forescatter</t> diode (FSD) imaging with varying detector tilt. (a) At low detector tilt, contrast is optimised to reveal surface topography, demonstrating black-white contrast (a-i and a-ii) either side of a preferentially polished region of the FCC phase, and objects are located on the top of the surface show the ‘RGB’ plume artefact due to preferential shadowing of electrons for each diode use to form the red, blue, and green diodes. As the detector is tilted towards higher screen positions as compared to the sample (b and c) the topography contrast is suppressed and the orientation contrast between grains and between sub-grains increases. Inserts are of higher magnification regions and examples of raw EBSD patterns are given to indicate the relative position of the detector and the incident electron signal. (For interpretation of the references to colour in this figure legend, the reader is referred to the web version of this article.)
3d Ebsd Data Acquisition, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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chroma cl  (Gatan Inc)
96
Gatan Inc chroma cl
Fig. 3. <t>Forescatter</t> diode (FSD) imaging with varying detector tilt. (a) At low detector tilt, contrast is optimised to reveal surface topography, demonstrating black-white contrast (a-i and a-ii) either side of a preferentially polished region of the FCC phase, and objects are located on the top of the surface show the ‘RGB’ plume artefact due to preferential shadowing of electrons for each diode use to form the red, blue, and green diodes. As the detector is tilted towards higher screen positions as compared to the sample (b and c) the topography contrast is suppressed and the orientation contrast between grains and between sub-grains increases. Inserts are of higher magnification regions and examples of raw EBSD patterns are given to indicate the relative position of the detector and the incident electron signal. (For interpretation of the references to colour in this figure legend, the reader is referred to the web version of this article.)
Chroma Cl, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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electron backscattering diffraction ebsd oim analysis  (AMETEK inc)
90
AMETEK inc electron backscattering diffraction ebsd oim analysis
Fig. 3. <t>Forescatter</t> diode (FSD) imaging with varying detector tilt. (a) At low detector tilt, contrast is optimised to reveal surface topography, demonstrating black-white contrast (a-i and a-ii) either side of a preferentially polished region of the FCC phase, and objects are located on the top of the surface show the ‘RGB’ plume artefact due to preferential shadowing of electrons for each diode use to form the red, blue, and green diodes. As the detector is tilted towards higher screen positions as compared to the sample (b and c) the topography contrast is suppressed and the orientation contrast between grains and between sub-grains increases. Inserts are of higher magnification regions and examples of raw EBSD patterns are given to indicate the relative position of the detector and the incident electron signal. (For interpretation of the references to colour in this figure legend, the reader is referred to the web version of this article.)
Electron Backscattering Diffraction Ebsd Oim Analysis, supplied by AMETEK inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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auger nano probe combined electron backscatter diffraction (auger-nano/ebsd  (ULVAC)
90
ULVAC auger nano probe combined electron backscatter diffraction (auger-nano/ebsd
Fig. 3. <t>Forescatter</t> diode (FSD) imaging with varying detector tilt. (a) At low detector tilt, contrast is optimised to reveal surface topography, demonstrating black-white contrast (a-i and a-ii) either side of a preferentially polished region of the FCC phase, and objects are located on the top of the surface show the ‘RGB’ plume artefact due to preferential shadowing of electrons for each diode use to form the red, blue, and green diodes. As the detector is tilted towards higher screen positions as compared to the sample (b and c) the topography contrast is suppressed and the orientation contrast between grains and between sub-grains increases. Inserts are of higher magnification regions and examples of raw EBSD patterns are given to indicate the relative position of the detector and the incident electron signal. (For interpretation of the references to colour in this figure legend, the reader is referred to the web version of this article.)
Auger Nano Probe Combined Electron Backscatter Diffraction (Auger Nano/Ebsd, supplied by ULVAC, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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symmetry  (Oxford Instruments)
98
Oxford Instruments symmetry
Fig. 3. <t>Forescatter</t> diode (FSD) imaging with varying detector tilt. (a) At low detector tilt, contrast is optimised to reveal surface topography, demonstrating black-white contrast (a-i and a-ii) either side of a preferentially polished region of the FCC phase, and objects are located on the top of the surface show the ‘RGB’ plume artefact due to preferential shadowing of electrons for each diode use to form the red, blue, and green diodes. As the detector is tilted towards higher screen positions as compared to the sample (b and c) the topography contrast is suppressed and the orientation contrast between grains and between sub-grains increases. Inserts are of higher magnification regions and examples of raw EBSD patterns are given to indicate the relative position of the detector and the incident electron signal. (For interpretation of the references to colour in this figure legend, the reader is referred to the web version of this article.)
Symmetry, supplied by Oxford Instruments, used in various techniques. Bioz Stars score: 98/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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electron backscatter diffraction  (Informa UK Limited)
90
Informa UK Limited electron backscatter diffraction
Fig. 3. <t>Forescatter</t> diode (FSD) imaging with varying detector tilt. (a) At low detector tilt, contrast is optimised to reveal surface topography, demonstrating black-white contrast (a-i and a-ii) either side of a preferentially polished region of the FCC phase, and objects are located on the top of the surface show the ‘RGB’ plume artefact due to preferential shadowing of electrons for each diode use to form the red, blue, and green diodes. As the detector is tilted towards higher screen positions as compared to the sample (b and c) the topography contrast is suppressed and the orientation contrast between grains and between sub-grains increases. Inserts are of higher magnification regions and examples of raw EBSD patterns are given to indicate the relative position of the detector and the incident electron signal. (For interpretation of the references to colour in this figure legend, the reader is referred to the web version of this article.)
Electron Backscatter Diffraction, supplied by Informa UK Limited, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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electron backscatter diffraction (ebsd)  (SIRION Biotech)
90
SIRION Biotech electron backscatter diffraction (ebsd)
Fig. 3. <t>Forescatter</t> diode (FSD) imaging with varying detector tilt. (a) At low detector tilt, contrast is optimised to reveal surface topography, demonstrating black-white contrast (a-i and a-ii) either side of a preferentially polished region of the FCC phase, and objects are located on the top of the surface show the ‘RGB’ plume artefact due to preferential shadowing of electrons for each diode use to form the red, blue, and green diodes. As the detector is tilted towards higher screen positions as compared to the sample (b and c) the topography contrast is suppressed and the orientation contrast between grains and between sub-grains increases. Inserts are of higher magnification regions and examples of raw EBSD patterns are given to indicate the relative position of the detector and the incident electron signal. (For interpretation of the references to colour in this figure legend, the reader is referred to the web version of this article.)
Electron Backscatter Diffraction (Ebsd), supplied by SIRION Biotech, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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electron backscattered diffraction (ebsd, oxford cnano)  (Cnano Technology Limited)
90
Cnano Technology Limited electron backscattered diffraction (ebsd, oxford cnano)
Fig. 3. <t>Forescatter</t> diode (FSD) imaging with varying detector tilt. (a) At low detector tilt, contrast is optimised to reveal surface topography, demonstrating black-white contrast (a-i and a-ii) either side of a preferentially polished region of the FCC phase, and objects are located on the top of the surface show the ‘RGB’ plume artefact due to preferential shadowing of electrons for each diode use to form the red, blue, and green diodes. As the detector is tilted towards higher screen positions as compared to the sample (b and c) the topography contrast is suppressed and the orientation contrast between grains and between sub-grains increases. Inserts are of higher magnification regions and examples of raw EBSD patterns are given to indicate the relative position of the detector and the incident electron signal. (For interpretation of the references to colour in this figure legend, the reader is referred to the web version of this article.)
Electron Backscattered Diffraction (Ebsd, Oxford Cnano), supplied by Cnano Technology Limited, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Image Search Results


Fig. 3. Forescatter diode (FSD) imaging with varying detector tilt. (a) At low detector tilt, contrast is optimised to reveal surface topography, demonstrating black-white contrast (a-i and a-ii) either side of a preferentially polished region of the FCC phase, and objects are located on the top of the surface show the ‘RGB’ plume artefact due to preferential shadowing of electrons for each diode use to form the red, blue, and green diodes. As the detector is tilted towards higher screen positions as compared to the sample (b and c) the topography contrast is suppressed and the orientation contrast between grains and between sub-grains increases. Inserts are of higher magnification regions and examples of raw EBSD patterns are given to indicate the relative position of the detector and the incident electron signal. (For interpretation of the references to colour in this figure legend, the reader is referred to the web version of this article.)

Journal: Materials Characterization

Article Title: Space rocks and optimising scanning electron channelling contrast

doi: 10.1016/j.matchar.2018.06.001

Figure Lengend Snippet: Fig. 3. Forescatter diode (FSD) imaging with varying detector tilt. (a) At low detector tilt, contrast is optimised to reveal surface topography, demonstrating black-white contrast (a-i and a-ii) either side of a preferentially polished region of the FCC phase, and objects are located on the top of the surface show the ‘RGB’ plume artefact due to preferential shadowing of electrons for each diode use to form the red, blue, and green diodes. As the detector is tilted towards higher screen positions as compared to the sample (b and c) the topography contrast is suppressed and the orientation contrast between grains and between sub-grains increases. Inserts are of higher magnification regions and examples of raw EBSD patterns are given to indicate the relative position of the detector and the incident electron signal. (For interpretation of the references to colour in this figure legend, the reader is referred to the web version of this article.)

Article Snippet: Forescatter electron imaging was captured using the ARGUS imaging system, mounted on a Bruker e-Flash FS EBSD detector and EDS data was acquired using a Bruker XFlash 6|60 detector.

Techniques: Imaging

Fig. 4. Forescatter diode (FSD) imaging with varying detector distance. (a) The ‘near’ position has a detector approx. 15 mm from the sample, (b) ‘medium’ at 20 mm, and (c) ‘far’ at 25 mm. Contrast in the near condition is strongly dominated by topography, and the far condition (for this detector tilt) high- lights contrast for the crystal orientation. Inserts are of higher magnification regions and an example EBSD pattern to indicate the relative position of the detector and the incoming electron signal.

Journal: Materials Characterization

Article Title: Space rocks and optimising scanning electron channelling contrast

doi: 10.1016/j.matchar.2018.06.001

Figure Lengend Snippet: Fig. 4. Forescatter diode (FSD) imaging with varying detector distance. (a) The ‘near’ position has a detector approx. 15 mm from the sample, (b) ‘medium’ at 20 mm, and (c) ‘far’ at 25 mm. Contrast in the near condition is strongly dominated by topography, and the far condition (for this detector tilt) high- lights contrast for the crystal orientation. Inserts are of higher magnification regions and an example EBSD pattern to indicate the relative position of the detector and the incoming electron signal.

Article Snippet: Forescatter electron imaging was captured using the ARGUS imaging system, mounted on a Bruker e-Flash FS EBSD detector and EDS data was acquired using a Bruker XFlash 6|60 detector.

Techniques: Imaging